Many time-resolved techniques to study charge carrier recombination involve pulsed high-power optical excitation and photo-generated carrier densities many orders of magnitude higher than present under typical solar cell operating conditions. In this report, we demonstrate a steady-state contactless microwave conductivity technique to evaluate the photoconductivity of carriers in semiconductors at low illumination intensity, as a function of optical power density. We studied characteristics of both thin films and single crystals of a hybrid halide perovskite compound, methylammonium lead iodide (MAPbI3). The aggregate mobility-lifetime product of majority and minority carriers in thin films of MAPbI3 was determined and found to be highly-dependent on incident optical power density, even at sub-1-sun illumination intensities, and attributed to trap states within the films.

The recent emergence of solar cells based on hybrid halide perovskites, and related compounds, has been one of the most disruptive events in the field of solar energy for many years.1–3 Despite being processable from solution at low temperatures (≤100 °C),4,5 solar cells based on hybrid organic metal-halide, Pb-based compounds with the general perovskite formula ABX3, exhibit certified power conversion efficiencies (PCEs) in-excess of those of polycrystalline silicon.6 These compounds possess optoelectronic properties that are, by many metrics, extraordinary.3,7–18 They are strong absorbers in the visible and near-infrared portion of the solar spectrum,11,19 have high charge-carrier mobilities,15,20 exhibit carrier-diffusion lengths on the order of microns,9,10 display an unusually low concentration11,21 of energetically shallow15 electronic traps states, and demonstrate evidence of photon recycling.18 

Understanding the optoelectronic properties of this class of semiconductors is an intense area of research22,23 and is fundamental to determining their potential performance.24 The power conversion efficiency of photovoltaic devices is intimately related to charge carrier mobilities and lifetimes of carriers in the semiconducting layer.25 The mobility-lifetime product (μτ) of charge carriers helps to determine the fill factor of solar cells because of the importance for charge extraction after generation.25–28 The charge carrier mobility of semiconducting materials can be evaluated using Hall effect measurements,29 space charge measurements,30 and measurements of thin-film transistors (TFTs).31,32 Carrying out such measurements requires the formation of continuous thin films or growth of single crystals, and often involves inducing charge-carrier densities many orders of magnitude higher than those present in solar cells under typical operating conditions.33 

Charge carrier lifetimes are evaluated using a variety of spectroscopic techniques, such as time-resolved photoluminescence spectroscopy,9,16 time-resolved microwave conductivity,15,34–36 transient absorption spectroscopy,37,38 and THz spectroscopy.20,39,40 The unusually long lifetimes observed in hybrid organic metal halide compounds,9,17,20,22,41–46 for example, have led to the investigation of many physical phenomena such as photon-recycling,18 the Rashba effect,47–50 and electron-phonon coupling.51 Time-resolved spectroscopic techniques are, therefore, highly valuable methods to investigate fundamental physical and material properties22 that inform future material and device design efforts.2 However the drawback with many transient spectroscopic measurements is that they employ a high-fluence optical source, and photo-generated charge-carrier densities are typically many orders of magnitude higher than under normal solar cell operating conditions.52 Charge carrier dynamics in disordered semiconductors are known to be strongly dependent on carrier density,33 and under high charge-densities, carrier dynamics will not necessarily be representative of those relevant for solar cell operation.28 Charge-carrier mobilities in disordered semiconductors are also known to be carrier-density dependent,53 and at high optical-fluence higher-order recombination processes (bimolecular and Auger) can dominate transient behavior.54 In the interest of gaining greater insight into the physical processes relevant for solar cells, the incentive to study charge carrier dynamics under typical solar cell operating conditions is therefore considerable.

An alternative approach is to study carrier dynamics using steady-state illumination28,43,55 rather than with high-fluence pulsed optical sources. In this report, we describe a simple and versatile contactless technique to study the photoconductivity of a semiconductor as a function of incident optical power-density at optical power densities of ≤1 sun. By employing thin solution-processed films of the highly-studied, hybrid-halide perovskite methylammonium lead iodide (MAPbI3),2,3,7,8 we evaluate a parameter ϕ Σ μ τ , a proxy for mobility-lifetime product, with a strong dependence on incident optical power densities even below 1 mW/cm2.

The technique we employ is a steady-state analog of the time-resolved microwave conductivity technique (TRMC)15,34,56–59 and based upon a system we have described previously.54,60,61 A circuit diagram of our apparatus is shown in Fig. 1(a), and a description of its operation is provided in the supplementary material Sec. S1.3. This technique, which we henceforth refer to as steady-state microwave conductivity (SSMC), employs a high-power green [ λ m a x  = 525 nm, see Fig. 1(b) for spectrum] light-emitting diode (LED) to illuminate a semiconducting sample in a microwave cavity. Because the method is contactless we do not need to form a device, deposit electrical contacts, or even have a continuous film. As with TRMC, this approach allows one to significantly reduce the number of optimization-parameters, and hence extract the properties of a semiconductor with little ambiguity with respect to contact-/device-based techniques. As with TRMC this technique is a probe of local transport in a direction parallel to the substrate based on the configuration of the sample in the cavity.34,60,61

FIG. 1.

(a) Schematic representation of steady-state microwave conductivity (SSMC) system employed in this study. The conductivity of the sample is modulated by directing collimated light from a commercial high power LED, through a chopper, into the microwave cavity. The modulation frequency can range from approximately 500 Hz to 4 kHz. (b) Optical absorbance of spin-cast thin film (∼100 nm thick) of MAPbI3 on fused silica (left) and normalized optical power density of incident light from green LED source (right).74 Inset: structure of MAPbI3 and schematic illustration of thin-film of MAPbI3 on fused silica. (c) Optical power density incident on the sample as a function of time. (d) Detected change in conductance of thin film of MAPbI3 as a function of time using SSMC technique by directly acquiring data from oscilloscope. Measurements were carried out at room temperature in air, by averaging over 2000 acquisitions. The data presented in (d) was acquired with an oscilloscope in the place of a lock-in amplifier in the circuit diagram in (a).

FIG. 1.

(a) Schematic representation of steady-state microwave conductivity (SSMC) system employed in this study. The conductivity of the sample is modulated by directing collimated light from a commercial high power LED, through a chopper, into the microwave cavity. The modulation frequency can range from approximately 500 Hz to 4 kHz. (b) Optical absorbance of spin-cast thin film (∼100 nm thick) of MAPbI3 on fused silica (left) and normalized optical power density of incident light from green LED source (right).74 Inset: structure of MAPbI3 and schematic illustration of thin-film of MAPbI3 on fused silica. (c) Optical power density incident on the sample as a function of time. (d) Detected change in conductance of thin film of MAPbI3 as a function of time using SSMC technique by directly acquiring data from oscilloscope. Measurements were carried out at room temperature in air, by averaging over 2000 acquisitions. The data presented in (d) was acquired with an oscilloscope in the place of a lock-in amplifier in the circuit diagram in (a).

Close modal

The normalized emission spectrum of this LED is shown in Fig. 1(b) along with an absorption spectrum of a thin film of MAPbI3. By passing a collimated beam of incident light through an optical chopper (with modulation frequency f m o d ∼1 kHz), the power density of the incident light is varied between 0 and 36 mW/cm2 [Fig. 1(c)]. Using the microwave conductivity system, we are able to detect the photo-induced change in the conductance of the sample as a function of time [Fig. 1(d)]. The change in photoconductance as a function of time ( Δ G ) shown in Fig. 1(d) is taken from 2000 accumulated averages. The fact that Δ G is not a square wave is attributed to instability of the chopper wheel and oscilloscope triggering mechanism over many averages. The modulation frequency of the incident light is sufficiently low (<10 kHz) to ensure that one half-cycle is enough time for the carrier density due to recombination, generation and diffusion to be in a steady state. This assumption is validated in the supplementary material Sec. S3, where it is determined for our film of MAPbI3, illumination timescales of <1 μs are required for Δ G to be affected by deviations from steady-state conditions. The time-constant of our cavity is approximately 60 ns,54,60,61 which is much shorter than illumination timescales under consideration for this study. The band gap of MAPbI3 is known to be approximately 1.5–1.6 eV,21 hence the energy of the incident photons (∼2.36 eV) is sufficient to ensure that carriers are generated by band-to-band transitions, rather than de-trapping, for example. While many thin-film organic metal halide semiconductors possess exciton binding energies on the order of 100 meV,62 MAPbI3 is known to have an exciton binding energy in the range of 5–60 meV and band-gap excitation generates carriers at room temperature.22 

The limit of detection of the directly detected data shown in Fig. 1(d) is not adequate to study the conductivity as a function of optical power density over a wide range. The background in the experiment could be reduced through better electrical isolation, further optimization of the cavity dimensions, or numerical filtering techniques. Instead we improved the sensitivity of the measurement by using a lock-in amplifier to measure the peak-to-peak Δ G as a function of optical power density, at modulation frequencies that still represent the steady state. The range of accessible generation rates could also be increased using an optical laser, instead of an LED, as the source.

Using lock-in detection, we examined the photoconductivity as a function of incident light intensity near the range of 1 sun illumination. With knowledge of the sample dimensions, the conductivity Δ σ was calculated from the conductance and plotted as a function of absorbed photons/cm3 ( F ) in Fig. 2. 1 sun is roughly equivalent to 1021–1022 photons/cm3 in MAPbI3. Photoconductivity is known to follow a power law, with the exponent ( γ ) revealing information on the dominant recombination mechanism(s), where F is assumed to be equal to the generation rate because of the high quantum efficiency of MAPbI328 

(1)
FIG. 2.

Change in conductivity with illumination (photoconductivity) of 100 nm thick thin film of MAPbI3 on fused silica measured using steady-state microwave conductivity (SSMC) as a function of number of absorbed photons per unit volume per second (F). The black squares are experimental data points, and the line is a fit to the power law in Eq. (1), with an exponent of γ  = 0.47.

FIG. 2.

Change in conductivity with illumination (photoconductivity) of 100 nm thick thin film of MAPbI3 on fused silica measured using steady-state microwave conductivity (SSMC) as a function of number of absorbed photons per unit volume per second (F). The black squares are experimental data points, and the line is a fit to the power law in Eq. (1), with an exponent of γ  = 0.47.

Close modal

Levine et al.28 recently reported a value of γ  = 0.40 for MAPbI3 measured using surface photovoltage (SPV) measurements, and Chen et al.43 reported γ  = 0.5 via electrical photoconductivity for thin films and single crystals of MAPbI3, at similar fluxes used in our study. We have fitted Eq. (1) to our data in Fig. 2, and observe an exponent of γ  = 0.47, in good agreement with previous reports.28,43 Differences in steady-state photocurrent-dependence are observed in the literature for different processing conditions43,63 and it is likely that trap states28,35,64 in the MAPbI3 play a strong role in the recombination dynamics at low carrier densities. The location of mid-gap traps in MAPbI3 have been suggested to depend on the substrate properties,64 and surface trapping is known to play a significant role in carrier recombination.65 While larger grains have been shown to lead to higher carrier mobilities66 and longer lifetimes16 in MAPbI3, the nature of trap states remains under debate and an area for future investigation.28,35,64

Under steady-state conditions, we can equate the rate of carrier generation ( n ̇ g for holes, p ̇ g for electrons), to the rate of carrier recombination ( n ̇ r for holes, p ̇ r for electrons)

(2)
(3)

Assuming band-to-band excitation dominates, the rate of carrier density generation is equal for holes and electrons. For a film of thickness d with a fractional absorption FA ∈ [0,1] and carrier generation efficiency ϕ ∈ [0,1], illuminated with light of optical power density P and wavelength of λ, the generation rate is expressed as

(4)

where h and c are the Planck constant and speed of light in a vacuum, respectively. Since we are concerned with low carrier densities, and hence predominantly trap-mediated recombination, we describe recombination via a single effective lifetime for each carrier type: τ i ( i = e for electrons, i = h for holes) rather than specific rate constants for trap-assisted, bimolecular and Auger recombination, respectively. Under these circumstances the recombination rate at a specific carrier density ( n for electrons, p for holes) can be approximated as

(5)
(6)

The photo-induced change in conductivity ( Δ σ ) is described in terms of hole and electron density, and hole and electron mobility through

(7)

where e is the magnitude of the fundamental unit of charge, and μ e and μ h are the electron and hole mobilites in the film, respectively. From Eqs. (2) to (4), we know that all generation and recombination rates are equal: n ̇ g = p ̇ g = n ̇ r = p ̇ r . Substituting Eqs. (4)–(6) into Eq. (7), we can therefore define a new parameter ϕ Σ μ τ (where Σ μ τ = τ e μ e + τ h μ h ) given by Eq. (8)

(8)

Because microwave conductivity experiments do not (conventionally) allow one to separate the charge dynamics of holes and electrons, parameters are typically extracted involving the sum of two parameters.15,34 The TRMC figure of merit ϕ Σ μ for example contains the sum of electron and hole mobilities: ( Σ μ = μ e + μ h ). The parameter ϕ Σ μ τ in Eq. (8) has the same dimensions as the mobility-lifetime product: μ τ , but carrier-type-specific information remains obscured, in an analogous manner to ϕ Σ μ in TRMC experiments. The influence of μ τ in solar cell performance is well known,25–28 and the ability to rapidly evaluate ϕ Σ μ τ at low carrier densities, without the need to form an electronic device is clearly valuable. Despite losing access to carrier-specific information, SSMC is a contactless technique and eliminates the static electric fields, which are a potential source of ionic diffusion processes in materials like MAPbI3,67 and can use low optical flux minimizing potential damage to the semiconductor.

ϕ Σ μ τ is plotted as a function of optical power density for our thin film of MAPbI3 in Fig. 3. For systems with low exciton binding energy (such as MAPbI3)22 we know that ϕ is very close to unity, and can hence interpret ϕ Σ μ τ in a similar way as to one would interpret μ τ . Carrier lifetimes in the range of roughly 200 ns–5 μs,9,20,22,41,64 and mobilities in the range of roughly 0.5–70 cm2/V s,9,10,39,64,66,68–70 have previously been reported for thin-films of MAPbI3. The values shown in Fig. 3 are therefore comparable with previous reports, but we draw attention to our observed intensity-dependence of ϕ Σ μ τ . By assuming that the electron mobility μ e , hole mobility μ h , and carrier-generation-efficiency ϕ, are approximately constant as function of carrier density, we conclude that the electron and/or hole lifetime is strongly dependent upon optical power density. In their report, Levine et al. observe ambipolar diffusion-lengths ( L D ) in MAPbI3 which are independent of excitation intensity.28 Because our technique does not isolate carrier-specific dynamics, and contains the carrier-generation efficiency ϕ, we cannot evaluate a value of L D for direct comparison to their study. Yamada et al. have observed a carrier lifetime that was independent of excitation intensity at low intensities and was dependent on intensity at high intensities.71 Our observed carrier-density-dependence of lifetime can be interpreted in terms of trap states,28,64 with the proximity of the Fermi level (moving under photoexcitation) to this trap state affecting the rate at which carriers are trapped or de-trapped. It is therefore not unreasonable to suggest that microstructure plays a significant role in the carrier-density-dependence of lifetime, as it does for absolute values of the lifetime.16 

FIG. 3.

ϕ Σ μ τ = ϕ τ e μ e + τ e μ e of 100 nm thick thin film of methylammonium lead iodide (MAPbI3) on fused silica measured using steady-state microwave conductivity (SSMC) as a function of optical power density.

FIG. 3.

ϕ Σ μ τ = ϕ τ e μ e + τ e μ e of 100 nm thick thin film of methylammonium lead iodide (MAPbI3) on fused silica measured using steady-state microwave conductivity (SSMC) as a function of optical power density.

Close modal

We grew single crystals of MAPbI3, using a previously reported inverse-crystallization technique.44 The crystal dimensions are roughly 2 mm × 2 mm × 2 mm, and the non-radiative and radiative recombination rates have been reported46 to be significantly lower than in thin films of MAPbI3: k n r ∼1 × 105 s−1 and k r a d ∼5 × 10−10 cm3/s, respectively. For these reasons, we expected the timescales for the system to reach equilibration between generation and recombination to be significantly longer in a crystal than in a thin film. The absolute conductance of a thin film and of a single crystal of MAPbI3 are shown as a function of modulation (chopper) frequency at an optical power density 46 mW/cm2 in Fig. 4. For a large (mm-scale) single crystal of MAPbI3, there is a clear dependence of microwave detected absolute photoconductance on modulation frequency; the value is generally lower than that of the thin film due to the difference in sample size. This difference in frequency dependence is attributed to the much-larger sample depth (∼2 mm for crystal vs. ∼100 nm for film) where carriers in the single crystal will not have diffused sufficiently to reach an equilibrium depth over the time-scales involved in our measurement. The much longer lifetimes reported46 in single crystals will require longer times for recombination and generation to equilibrate, even in the absence of an inhomogeneous carrier distribution. For these reasons, and the difficulty in determining the effective depth of the sample due to diffusion (the depth in which carriers are present), it is impossible to evaluate the parameter ϕ Σ μ τ for a single crystal using this technique, without a priori detailed knowledge of the carrier mobilities. Nonetheless, this data illustrates that carrier dynamics in single crystals of MAPbI3 occur over very long timescales (>100 μs), even in the absence of ionic diffusion effects,72,73 which should not be present in the GHz-frequency field employed in our measurement system, but could be present under constant-bias based techniques.17 

FIG. 4.

(a) Photoconductance of ∼100 nm thick thin film (area ∼10 mm × 10 mm) of methylammonium lead iodide ((MA)PbI3) on fused silica as a function of modulation frequency, measured using steady-state microwave conductivity at a constant optical power density of 46 mW/cm2. (b) Photoconductance of single crystal of methylammonium lead iodide (MAPbI3) as a function of modulation frequency, measured using steady-state microwave conductivity at a constant optical power density of 46 mW/cm2. Measurements were carried out at room temperature in air, using a lock-in amplifier. The peak emission wavelength of the LED was 525 nm.

FIG. 4.

(a) Photoconductance of ∼100 nm thick thin film (area ∼10 mm × 10 mm) of methylammonium lead iodide ((MA)PbI3) on fused silica as a function of modulation frequency, measured using steady-state microwave conductivity at a constant optical power density of 46 mW/cm2. (b) Photoconductance of single crystal of methylammonium lead iodide (MAPbI3) as a function of modulation frequency, measured using steady-state microwave conductivity at a constant optical power density of 46 mW/cm2. Measurements were carried out at room temperature in air, using a lock-in amplifier. The peak emission wavelength of the LED was 525 nm.

Close modal

In conclusion, we have demonstrated a contactless technique to characterize the conductivity of carriers in semiconductors using a simple LED light source at low illumination near effective 1 Sun conditions. This technique allows one to extract the parameter ϕ Σ μ τ , a proxy for the mobility-lifetime product, as a function of optical power density, at very low charge densities, without the need to construct a device/apply contacts, and in the absence of any field driven ionic motion. The ability to probe dynamics under typical operating conditions is relatively rare28,55 in the field of contactless optical spectroscopy, and we expect the method to provide information about regimes of carrier density that were previously inaccessible. As an example, we find that the observed ϕ Σ μ τ of thin films of MAPbI3 to be highly dependent on incident optical power density, even under sub-AM1.5 illumination conditions revealing the role of trap states in recombination.

See supplementary material for experimental methods, scanning electron microscope images, X-ray diffraction spectra, a theoretical verification of steady-state conditions in methylammonium lead iodide thin films, chopper-frequency-dependent conductance data, and details of the baseline correction employed.

Research on microwave conductivity and device properties was supported by the Defense Threat Reduction Agency (HDTRA1-15-1-0023). Research on crystal growth supported by DOE under Grant Award No. DE-SC-0012541. J.G.L. gratefully acknowledges Virgil Elings and Betty Elings Wells for financial support through the Elings Fellowship Awards. The authors thanks one of the anonymous reviewers for comments on the details of the experimental method.

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See https://www.thorlabs.com for “Solis™ High-Power LEDs for Microscopy Manual, ThorLabs” (Accessed 2018-05-25).

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