Progress in terahertz spectroscopy and imaging is mostly associated with femtosecond laser-driven systems, while solid-state sources, mainly sub-millimetre integrated circuits, are still in an early development phase. As simple and cost-efficient an emitter as a Gunn oscillator could cause a breakthrough in the field, provided its frequency limitations could be overcome. Proposed here is an application of the recently discovered collapsing field domains effect that permits sub-THz oscillations in sub-micron semiconductor layers thanks to nanometer-scale powerfully ionizing domains arising due to negative differential mobility in extreme fields. This shifts the frequency limit by an order of magnitude relative to the conventional Gunn effect. Our first miniature picosecond pulsed sources cover the 100–200 GHz band and promise milliwatts up to ∼500 GHz. Thanks to the method of interferometrically enhanced time-domain imaging proposed here and the low single-shot jitter of ∼1 ps, our simple imaging system provides sufficient time-domain imaging contrast for fresh-tissue terahertz histology.
The currently dominant terahertz time-domain spectroscopy and imaging technique is based on laser-driven pulse systems,1–4 the practical use of which is limited by their large size, high cost, and high power consumption. The option of miniaturizing the CW solid-state sources5–7 by means of SiGe CMOS or III-V hetero-bipolar transistor (HBT)/HEMT integrated circuits8,9 compatible with on-chip antennas10 suffers from complexity and low (sub-mW) power. Higher power, in the sub-terahertz range, can be obtained at the expense of further complication, costs, and size by using multipliers and amplifiers,11,12 or in the THz range using quantum cascade lasers,13 which require cryogenic temperatures.
Current trends in high-resolution THz imaging rely on both detector and emitter arrays7,14 offering real-time operation but requiring simple, miniature and energy-efficient solid-state sources. The simplest ever microwave oscillator based on the Gunn effect has an inherent limitation of about 80 GHz on its fundamental mode of operation with traditionally used GaAs. Use of hot electron injection,15 advanced semiconductor materials, and planar technology16 pushed the fundamental-mode frequency to 200–300 GHz, making the performance of the Gunn oscillators in the sub-THz band comparable to that of sub-millimetre IC, although their efficiency and output power remained low.
A recently discovered physical phenomenon termed the collapsing field domain (CFD)17 provides an original approach to the problem. First found in high-voltage (∼100–500 V) GaAs bipolar junction transistors (BJTs) during their superfast18,19 (picosecond) avalanche switching, these domains were proved in other experiments.17 Later, the same domains interpreted the old puzzle of superfast switching and lock-on in a bulk GaAs optically triggered switch.20 Despite the fact that the GaAs structures of the high-voltage avalanche transistors mentioned above, optically triggered switches20 and the low-voltage sub-micron THz emitters suggested here differ drastically from each other, the properties of the CFDs in all these structures are the same. The collapsing domains are physically caused by negative differential mobility (NDM) in extreme electric fields (above the ionization threshold),21 and the most detailed experimental and numerical investigation into their properties was undertaken using both hydrodynamic22 and drift-diffusion17–19,23 approaches for high-voltage bipolar transistors. This study inspired the idea of realizing CFD in a miniature, low-voltage source in which a nano-scale domain circulating in a sub-micron active layer would produce pulsed sub-THz emission.
We present here a description of the original source and its operation principle which has allowed sub-picosecond time-domain imaging (TDI) resolution to be achieved and a method to be developed, termed here interferometrically enhanced time-domain imaging (IE-TDI). This method provides an order of magnitude improvement in time-of-flight imaging contrast.
The basic architecture of our sub-THz source, having a BJT structure with a submicron n0 collector layer, is shown in Fig. 1(a). It was grown using vapour-phase (MOVPE, Aixtron 200/4) or molecular beam (MBE, Riber 49) epitaxy on semi-insulating substrates and processed using state-of-the-art technology similar to that of HBT fabrication. Both subcollector (∼1 μm in thickness) and emitter (∼50 nm in thickness and ∼8 μm2 in area) are doped with a donor (Si) density of ∼(4–6)×1018 cm−3 while a p-base of ∼70 nm in thickness is doped by carbon to 3 × 1019 cm−3 aiming at low base-emitter resistance. Direct on-chip connections of the emitter and collector ohmic contacts to the antenna flares ensured as low parasitic inductance as a few pH, while the “external circuit” also realized on the chip provided total loop inductance below ∼1 nH. It is important for our device to have a specific contact resistivity to the emitter as low as ∼10−7 Ω × cm2, since the current density in the switching channels reaches ∼107 A/cm2. In our processes, the contact resistivity for heavily doped InGaAs layers ranged from 2 × 10−7 to 6 × 10−7 Ω × cm2, while for GaAs heavily doped with tellurium, the resistivity did not typically exceed 0.6 × 10−7 Ω × cm2.
The sub-THz emitter: structure, on-chip view, and transient characteristics. (a) An example of a BJT transistor-like GaAs emitter structure. The micron-sized transistor is integrated with a sub-mm on-chip bow-tie antenna. The emitter and collector are also connected to the external miniature on-chip components C and RL, possessing parasitic inductance L. The load resistor RL ∼1 Ω allows measurement of the current waveform but does not reduce the collector voltage due to base current amplification, thus permitting avalanche switching. (b) Experimental (index E) current curves IE(1) for (1) and IE(2) for (2) generation of the emitters; experimental [VE(1)] and simulated [VS(1)] voltage waveforms for (1) generation (see physics-based modelling method in Refs. 17–19). (c) Experimental emission waveforms for the first [LE(1)] and second [LE(2)] emitter generations related to the switching transients in (b). (d) Measured spectra corresponding to the waveforms in (c).
The sub-THz emitter: structure, on-chip view, and transient characteristics. (a) An example of a BJT transistor-like GaAs emitter structure. The micron-sized transistor is integrated with a sub-mm on-chip bow-tie antenna. The emitter and collector are also connected to the external miniature on-chip components C and RL, possessing parasitic inductance L. The load resistor RL ∼1 Ω allows measurement of the current waveform but does not reduce the collector voltage due to base current amplification, thus permitting avalanche switching. (b) Experimental (index E) current curves IE(1) for (1) and IE(2) for (2) generation of the emitters; experimental [VE(1)] and simulated [VS(1)] voltage waveforms for (1) generation (see physics-based modelling method in Refs. 17–19). (c) Experimental emission waveforms for the first [LE(1)] and second [LE(2)] emitter generations related to the switching transients in (b). (d) Measured spectra corresponding to the waveforms in (c).
Of prime importance for device operation is avalanche switching, which implies avalanche injection into the n0 layer (≤0.7 μm in thickness) of the impact-generated holes that in turn cause electron injection from the emitter across the p–base. Biased initially to the voltage close to the base-collector breakdown (≤23 V), avalanching is triggered by the current pulse applied to the base. The high base doping at a relatively low donor concentration in the emitter (in the absence of hetero-barrier for the holes) determines very low common emitter current gain β ∼0.1. This is not acceptable for an amplifier, but suffices for triggering of the avalanche switching.
The low-ohmic load and very low β prevent the collector voltage reduction due to base current amplification that would happen in “linear” hetero-bipolar transistor (HBT) amplifiers. (HBT with low-ohmic load might be applicable as well, but with various complications. In particular, a static high-field domain in hetero-emitter competing with moving CFDs may appear, and thus the development of a HBT-based avalanche sub-THz source is an open question). The electron injection modifies the collector field domain in such a way that the peak in the electric field arises at the n0-n+collector interface, exceeding the ionization threshold. The resulting double injection of the electrons and holes creates electron-hole plasma in the n0 layer. Then, CFD forms at the base-collector interface and starts moving towards the n+ subcollector provided the current density exceeds ∼1 MA/cm2. [Note the three domains of ∼0.4–0.6 MV/cm in amplitude and ∼100–50 nm in width simulated in this work and shown in Fig. 1(a)]. The reasonable agreement between the measured and simulated waveforms [see Fig. 1(b)] confirms the parameters of the CFDs, the current, and carrier densities in the switching channels and the lattice temperature, etc., that were obtained in the simulations.
The studies of the 3-D peculiarities of avalanche switching in high-voltage BJTs18,19,23 performed so far show a filamentary switching character, with one or more switching channels of a diameter comparable to the thickness of the n0 collector layer. In our case, this means one or more channels of area ∼1 μm2 [see magenta cylinders in Fig. 1(a)]. Despite the extreme current density in the channel and the electric field amplitudes, there is no danger for the device, as a CFD circulates for only a limited time (∼100 ps) and the lattice overheating after a single avalanche switching is only ∼30 K.
Unlike the large number of CFDs coexisting in the n0 layer of a high-voltage transistor, the single CFD circulates in the submicron n0 collector of this our device as in a Gunn diode: nucleating near the anode (base) and annihilating at the cathode (n+ subcollector). The travel time of CFD across the n0 layer (<10ps) determines the period of sub-THz emission, while the wavetrain length is determined by the current pulse duration (discharge time of capacitor C). Sub-THz current oscillations pass across the on-chip antenna and cause emission of the wavetrain [coloured blue in Fig. 1(a)], with a central oscillation frequency f0 determined by the domain transit time.
Initial measurements of the resulting THz emission have been made using a large elliptical mirror. The chip was placed at one focus of the mirror while the receivers (zero bias Schottky detectors of Virginia Diodes equipped with horn antennas) were mounted near the other focus. The waveforms of the detected pulses were recorded using a LeCroy WaveMaster 830Zi-A oscilloscope. Examples of waveforms obtained for the pulsed sources of the first and second emitter generations are given in Fig. 1(c), and their spectra, evaluated using a set of resonant metal-mesh THz bandpass filters, are shown in Fig. 1(d). To measure the output power of the source, the Schottky detectors were replaced with a Golay cell. Alternatively, for the transmission imaging mode, the source was glued onto hyper-hemispherical silicon lens and the THz pulse was further collimated using a polytetrafluoroethylene (PTFE) lens of focal length 10 mm.
Figure 2 illustrates the advantage of using for the transmission TDI a second-generation source with single-shot jitter reduced from the ∼10 ps (typical of the first generation) to ∼1 ps and a somewhat increased central frequency of the wavetrain. The much better shape stability and lower jitter of the pulse emitted by the second-generation source [IE(2), LE(2) curves in Fig. 1(b)] may be attributed to the realization of single channel operation. We assume that the much higher jitter in the first-generation source was caused by the multichannel character of the switching18,23 when several conducting channels, each having its own sub-THz oscillations figure, mutually shunt the oscillations generated in the other channels, thus obstructing their penetration to the antenna. The randomness of the switching instants for the different channels unavoidably increases this jitter and causes variations in the front edge shapes of individual pulses. A number of technological and circuitry measures implemented for suppressing multichannel operation in the second-generation source require detailed discussions and will be presented elsewhere.
(a)-Sub-THz time-domain image of a comb using a transmitted delay (t-domain image) for a pulse of ∼50 ps and single-shot jitter as low as ∼1 ps (second generation of our CFD emitters); (b) shows for comparison a TDI using a ∼1.2 ns pulse with a jitter of ∼10 ps (first generation of emitters).
(a)-Sub-THz time-domain image of a comb using a transmitted delay (t-domain image) for a pulse of ∼50 ps and single-shot jitter as low as ∼1 ps (second generation of our CFD emitters); (b) shows for comparison a TDI using a ∼1.2 ns pulse with a jitter of ∼10 ps (first generation of emitters).
Due to the significant improvement in the spatial resolution and quality of the image [compare (a) and (b) in Fig. 2], more challenging applications can now be addressed. Sub-picosecond precision is needed, e.g., for differentiating healthy and malignant areas in freshly excised tissue slices, and this may open the way to intra-operative real-time histology in cancer surgery (as a replacement for the laboratory-demonstrated optoelectronic THz TDI approach,24,25 which suffers from the large setup size, high costs, etc.). In our transmission experiments with fresh samples of breast tissue, the time delay corresponding to a slice thickness of 200 μm was around 1 ps, with the jitter reduced to ∼0.1–0.3 ps by averaging 100 measurements. Such accuracy is not sufficient for reliable cancer detection, while any further increase in slice thickness would reduce the transmitted signal. To solve this dilemma, we suggest interferometric enhancement (IE) for a significant improvement in TDI contrast. This IE-TDI method utilizes the reflection mode and the intrinsic properties of the wavetrains emitted by our source.
We used an original reflection-mode setup permitting only a ∼30% reduction in the amplitude of the emitted pulse instead of the 75% reduction optimistically expected in the traditional scheme employing a THz beamsplitter. A hollow dielectric waveguide with an internal diameter of 20 mm (termed a beamguide26) was excited at the centre by an emitter chip glued onto a Si lens, and the resulting wavefront was focused on the tissue slice using a PTFE lens (25.4 mm in diameter, focal length 25 mm). The reflected wave spreading back in the beamguide crossed the excitation point and was collected by a horn into the waveguide of the Schottky detector. The system resolution was ∼3.5 mm.
The tissue slice was placed on a quartz substrate backed with a metal mirror, and the contrast between the cancerous and healthy tissues was then evaluated from the variations in the time delay of the reflected signal during 2-D scanning of the sample. The waves reflected from the metal mirror and the quartz surface [Fig. 3(a)] interfere constructively [Fig. 3(b)] or destructively [Fig. 3(c)], causing shifts in the leading edge of the resultant pulse [Fig. 3(d)]. The time delay in the envelope of the reflected sub-THz pulse was calculated by the spectral method. The results of the numerical calculations and corresponding experimental points are given in Fig. 3(e) for two substrate materials, quartz and polyethylene terephthalate (PETP). The shape of wavetrain used is shown [FWHM ∼40ps, spectral width Δf ≈ ±20 GHz, see the green inset in Fig. 3(e)].
Principle of contrast enhancement for a time-delay image. (a)–(d) Interference of wavetrains reflected from the metal mirror [coloured black in the draft (a) and graphs (b) and (c)] with those reflected from the top surface of the dielectric layer (blue) modifies the resulting wavetrain shape in a manner dependent on the dielectric thickness d (magenta for d1 and red for d2). In-phase interference for thickness d2 in (b) results in a reduced delay td in the wavetrain envelope as recorded by the Schottky detector (d), because top reflection lifts the leading edge whereas the reverse phase (c) acts conversely, thus increasing the delay. (e) The simulated (solid black) and measured (scattered black) values for the dependence of the pulse delay Δtd on the dielectric thickness are shown together with interference-ignored delay (linear, relative to that in air, dashed black line) for PETP (refractive index n = 1.6). More powerful oscillations in the delay Δtd manifest themselves in the quartz substrate (n = 1.95), as presented by the orange line (dashed line for the “linear” regime, ignoring interference) and experimental points. The fractions of the curve highlighted in blue and red are those used in cancer mapping, as shown in Fig. 4. For 1.0 mm and 1.2 mm quartz substrates the dependence of the delay on thickness is an order of magnitude steeper than that shown by the dashed line, implying drastic contrast enhancement.
Principle of contrast enhancement for a time-delay image. (a)–(d) Interference of wavetrains reflected from the metal mirror [coloured black in the draft (a) and graphs (b) and (c)] with those reflected from the top surface of the dielectric layer (blue) modifies the resulting wavetrain shape in a manner dependent on the dielectric thickness d (magenta for d1 and red for d2). In-phase interference for thickness d2 in (b) results in a reduced delay td in the wavetrain envelope as recorded by the Schottky detector (d), because top reflection lifts the leading edge whereas the reverse phase (c) acts conversely, thus increasing the delay. (e) The simulated (solid black) and measured (scattered black) values for the dependence of the pulse delay Δtd on the dielectric thickness are shown together with interference-ignored delay (linear, relative to that in air, dashed black line) for PETP (refractive index n = 1.6). More powerful oscillations in the delay Δtd manifest themselves in the quartz substrate (n = 1.95), as presented by the orange line (dashed line for the “linear” regime, ignoring interference) and experimental points. The fractions of the curve highlighted in blue and red are those used in cancer mapping, as shown in Fig. 4. For 1.0 mm and 1.2 mm quartz substrates the dependence of the delay on thickness is an order of magnitude steeper than that shown by the dashed line, implying drastic contrast enhancement.
The IE-TDI principle consists of maximization of the increment in the experimentally measurable pulse delay caused by variations in the effective substrate thickness (thickness × refractive index). Selection of the operating point near the slope centres of the solid lines in Fig. 3(e) by proper selection of the substrate thickness under the layer of interest yields an order of magnitude gain with respect to the dashed lines representing the conventional round-trip propagation delay in the dielectric layer (i.e., ignoring reflections from the dielectric interfaces).
The fractions of the orange curve highlighted in blue and red in Fig. 3(e) were used for the experimental studies of healthy and malignant tissues by IE-TDI in comparison with conventional amplitude and time-delay images (Fig. 4).
Images of similar (but not precisely identical) slices made one-by-one using the same fresh-frozen breast tumour specimen. (a) Photo; (b) histology, in which the cancer area is tinged violet-pink, the pink “islands” corresponding to the fibrous tissue and the transparent zone to the fat tissue. (c) Amplitude image of a slice of thickness 100 μm mounted on a 1.2 mm quartz submount and measured in the reflection mode. (d) Time-domain image of a slice of thickness 200 μm on a 1.2 mm quartz submount obtained in the transmission mode. (e) Time-domain image of a slice of thickness 100 μm on a 1.2 mm quartz submount in the reflection mode, and (f) time-domain image of a slice of thickness 100 μm on a 1.0 mm quartz submount obtained in the reflection mode. The transmission image in (d) shows a small positive cancerous area contrast ∼1 ps (comparable to the single-shot jitter), the reflection image in (e) achieves a ∼3 to 4-fold improvement with positive (+5 ps) contrast [see slope highlighted in red in Fig. 3(e)], and (f) presents an even better negative contrast (–13ps) corresponding to the slope highlighted in blue in Fig. 3(e).
Images of similar (but not precisely identical) slices made one-by-one using the same fresh-frozen breast tumour specimen. (a) Photo; (b) histology, in which the cancer area is tinged violet-pink, the pink “islands” corresponding to the fibrous tissue and the transparent zone to the fat tissue. (c) Amplitude image of a slice of thickness 100 μm mounted on a 1.2 mm quartz submount and measured in the reflection mode. (d) Time-domain image of a slice of thickness 200 μm on a 1.2 mm quartz submount obtained in the transmission mode. (e) Time-domain image of a slice of thickness 100 μm on a 1.2 mm quartz submount in the reflection mode, and (f) time-domain image of a slice of thickness 100 μm on a 1.0 mm quartz submount obtained in the reflection mode. The transmission image in (d) shows a small positive cancerous area contrast ∼1 ps (comparable to the single-shot jitter), the reflection image in (e) achieves a ∼3 to 4-fold improvement with positive (+5 ps) contrast [see slope highlighted in red in Fig. 3(e)], and (f) presents an even better negative contrast (–13ps) corresponding to the slope highlighted in blue in Fig. 3(e).
The poorest cancer/image correlation was observed in the amplitude image [Fig. 4(c)], while the time-delay image [Fig. 4(d)] is considerably better, despite the fact that the time-delay contrast of ∼1 ps does not seem to be quite sufficient. Significant improvements were achieved using IE-TDI even for thinner tissue samples of 100 μm, providing a direct contrast of +5 ps for a 1.2 mm quartz submount and a reverse contrast of –13 ps for 1.0 mm (see images (e) and (f) in Fig. 4).
More complicated differentiation between fibrous and malignant tissue requires recording TDI delay differences of ∼0.2 ps, which are hardly measurable by conventional transmission, while IE-TDI can resolve this challenging task. The proposed method is therefore well suited for intra-operative detection of malignant tissues and corresponds to the current medical trend for point-of-care diagnostics.
In summary, the miniature sub-THz source suggested here is well suited for high-resolution imaging arrays, and its combination with the IE-TDI method approaches the time-domain contrast obtainable at present only with bulky and costly optoelectronic systems.
This work was supported by the Academy of Finland and TEKES (Grant Nos. 255359 and 310152), and the strategic TEKES MIWIM project. The authors are grateful for engineering support from MNTC at the University of Oulu.
Permission for use of the breast cancer tissue samples (Reg. No. 59-2009) was obtained from the Institutional Ethical Board of Oulu University Hospital, Finland.