Magnetic-field dependent Hall-effect measurements and mobility spectrum analysis were employed to study anisotropic transport in N-polar GaN/Al0.3Ga0.7N heterostructures grown on vicinal sapphire substrates. The significant anisotropy in the mobility in the parallel and perpendicular directions to the miscut direction was accompanied by a slight anisotropy in charge density. A single electron species was found in the direction parallel to the steps resulting from growth on the vicinal substrates; while in the perpendicular direction two distinct electrons peaks were evident at T150K. The lower average mobility in the perpendicular direction is attributed to interface roughness scattering.

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