Grazing-incidence x-ray diffraction from GaN epitaxial layers with threading dislocations Available to Purchase

We used high-resolution x-ray reciprocal space mapping in noncoplanar grazing-incidence geometry for the determination of the density of edge threading dislocations in c-oriented GaN epitaxial layers and we compared the measured intensity distributions with results of numerical Monte Carlo simulations of diffuse scattering. We demonstrated that a combination of diffraction data taken in coplanar symmetric and noncoplanar grazing-incidence geometries makes it possible to obtain the densities of screw and edge threading dislocations.