We have developed a straightforward plasma-based method which yields chlorine-terminated n-type surfaces. Atomic force microscopy shows that the surface roughness is not affected by the plasma processing. Additionally, x-ray photoelectron spectroscopy reveals a significant reduction in oxygen, and a corresponding rise of chlorine core level intensities, following halogen termination. Contact potential difference and surface photovoltage measurements show formation of negative surface dipoles and approximately flat band surface potentials after chlorine termination of (0001) n-type (built-in voltage ). Starting from halogenated surfaces, we demonstrate both ultraviolet light-induced and thermally-induced functionalization with alkene-derived self-assembled organic monolayers.
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2 May 2011
Research Article|
May 06 2011
Electrical passivation and chemical functionalization of SiC surfaces by chlorine termination
S. J. Schoell;
S. J. Schoell
Walter Schottky Institut and Physik Department,
Technische Universität München
, Am Coulombwall 4, 85748 Garching, Germany
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J. Howgate;
J. Howgate
Walter Schottky Institut and Physik Department,
Technische Universität München
, Am Coulombwall 4, 85748 Garching, Germany
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M. Hoeb;
M. Hoeb
Walter Schottky Institut and Physik Department,
Technische Universität München
, Am Coulombwall 4, 85748 Garching, Germany
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M. Auernhammer;
M. Auernhammer
Walter Schottky Institut and Physik Department,
Technische Universität München
, Am Coulombwall 4, 85748 Garching, Germany
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J. A. Garrido;
J. A. Garrido
Walter Schottky Institut and Physik Department,
Technische Universität München
, Am Coulombwall 4, 85748 Garching, Germany
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M. Stutzmann;
M. Stutzmann
Walter Schottky Institut and Physik Department,
Technische Universität München
, Am Coulombwall 4, 85748 Garching, Germany
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M. S. Brandt;
M. S. Brandt
Walter Schottky Institut and Physik Department,
Technische Universität München
, Am Coulombwall 4, 85748 Garching, Germany
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I. D. Sharp
I. D. Sharp
a)
Walter Schottky Institut and Physik Department,
Technische Universität München
, Am Coulombwall 4, 85748 Garching, Germany
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a)
Electronic mail: [email protected].
Appl. Phys. Lett. 98, 182106 (2011)
Article history
Received:
January 29 2011
Accepted:
April 15 2011
Citation
S. J. Schoell, J. Howgate, M. Hoeb, M. Auernhammer, J. A. Garrido, M. Stutzmann, M. S. Brandt, I. D. Sharp; Electrical passivation and chemical functionalization of SiC surfaces by chlorine termination. Appl. Phys. Lett. 2 May 2011; 98 (18): 182106. https://doi.org/10.1063/1.3587767
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