Ferroelectricity is attractive in data storage application as the polarizations can be used as binary levels. However, conductivity and ferroelectricity cannot be tuned independently in inorganic materials, thus two-terminal resistive memories with ferroelectrics are yet to be achieved. Here, we present an all-polymer-based system of semiconductor/ferroelectrics/semiconductor. Electrical switching behavior, which is critical to resistive memories, is observed. The mechanism of the conduction transition is attributed to the transmission probability of charge carriers tuned by electrical polarization. The importance of polarization in controlling the charge transport deserves further investigation for the realization and optimization of the two-terminal resistive memories with ferroelectrics.
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25 April 2011
Research Article|
April 29 2011
Electrical switching behavior from all-polymer-based system of semiconductor/ferroelectrics/semiconductor
Yun Li;
Yun Li
1Key Laboratory of Photonic and Electronic Materials and School of Electronic Science and Engineering,
Nanjing University
, Nanjing 210093, People's Republic of China
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Chuan Liu;
Chuan Liu
2
Cavendish Laboratory
, Madingley Road, Cambridge CB3 0HE, United Kingdom
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Lijia Pan;
Lijia Pan
1Key Laboratory of Photonic and Electronic Materials and School of Electronic Science and Engineering,
Nanjing University
, Nanjing 210093, People's Republic of China
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Lin Pu;
Lin Pu
1Key Laboratory of Photonic and Electronic Materials and School of Electronic Science and Engineering,
Nanjing University
, Nanjing 210093, People's Republic of China
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Henning Sirringhaus;
Henning Sirringhaus
2
Cavendish Laboratory
, Madingley Road, Cambridge CB3 0HE, United Kingdom
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a)
Author to whom should be addressed. Electronic mail: yshi@nju.edu.cn.
Appl. Phys. Lett. 98, 173306 (2011)
Article history
Received:
January 13 2011
Accepted:
April 12 2011
Citation
Yun Li, Chuan Liu, Lijia Pan, Lin Pu, Henning Sirringhaus, Yi Shi; Electrical switching behavior from all-polymer-based system of semiconductor/ferroelectrics/semiconductor. Appl. Phys. Lett. 25 April 2011; 98 (17): 173306. https://doi.org/10.1063/1.3584854
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