Threading dislocations in CeO2 thin films grown on yttria-stabilized ZrO2 substrates were investigated by transmission electron microscopy (TEM), high-resolution TEM, and scanning TEM. It is revealed that there are two kinds of threading dislocations with the Burgers vector of b=1/2110: one is pure edge-type and the other is mixed-type. Comparing the strain field of the mixed-type dislocations with that of the Peierls–Nabarro and the Foreman dislocation models, we find that the Foreman model better describes it in CeO2.

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