In percolating networks of mixed metallic and semiconducting carbon nanotubes (CNTs), there is a tradeoff between high on-current (dense networks) and high on/off ratio (sparse networks). Experiments on transistors and Monte Carlo simulations were performed to determine the scaling behavior of device resistivity as a function of channel length (L) for CNT density (p) between 0.04 and 1.29CNTs/μm2 in the on- and off-states (nanotube root mean square length of 5μm). Optimized devices with field-effect mobility up to 50cm2/Vs at on/off ratio >103 were obtained at channel width W=50μm and L>70μm for p=0.540.81CNTs/μm2.

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