Secondary electron yield from individual multiwalled carbon nanotubes is investigated for a wide range of primary beam energies (0.5–15 keV). By using a simple experimental procedure under an optical microscope, we make suspended nanotubes, which are free from interaction with the substrate during electron yield measurements. It is found that the secondary electron yield from isolated suspended nanotubes is less than unity and decreases as a function of primary electron energy.
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