Epitaxial graphene films grown on silicon carbide (SiC) substrate by solid state graphitization is of great interest for electronic and optoelectronic applications. In this paper, we explore the properties of epitaxial graphene films on 3C-SiC(111)/Si(111) substrate. X-ray photoelectron spectroscopy and scanning tunneling microscopy were extensively used to characterize the quality of the few-layer graphene (FLG) surface. The Raman spectroscopy studies were useful in confirming the graphitic composition and measuring the thickness of the FLG samples.
Epitaxial graphene on cubic SiC(111)/Si(111) substrate
A. Ouerghi, A. Kahouli, D. Lucot, M. Portail, L. Travers, J. Gierak, J. Penuelas, P. Jegou, A. Shukla, T. Chassagne, M. Zielinski; Epitaxial graphene on cubic SiC(111)/Si(111) substrate. Appl. Phys. Lett. 10 May 2010; 96 (19): 191910. https://doi.org/10.1063/1.3427406
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