We demonstrate efficient electron injection from a high work function metal in staggered transistors based on the high mobility poly{[N,N-bis(2-octyldodecyl)-naphthalene-1,4,5,8-bis(dicarboximide)-2,6-diyl]-alt-5,5-(2,2-bithiophene)}. Channel length scaling shows that the linear mobility for electrons remains higher than 0.1cm2/Vs when reducing the channel length to a few micrometers. Field-enhanced injection favors downscaling at a fixed lateral voltage and reduces the contact resistance to 11kΩcm at high gate voltages for channels of only a few micrometers. The contacts are asymmetric, with the source contribution dominating the overall resistance, consistent with an injection limited regime rather than bulk-limited as generally found in staggered transistors.

1.
L.
Bürgi
 et al.,
J. Appl. Phys.
94
,
6129
(
2003
).
2.
B. A.
Gregg
 et al.,
Chem. Mater.
16
,
4586
(
2004
).
3.
M.
Kitamura
 et al.,
Appl. Phys. Lett.
93
,
033313
(
2008
).
4.
C. R.
Newman
 et al.,
Chem. Mater.
16
,
4436
(
2004
).
5.
J.
Zaumseil
and
H.
Sirringhaus
,
Chem. Rev. (Washington, D.C.)
107
,
1296
(
2007
).
6.
H.
Usta
 et al.,
J. Am. Chem. Soc.
131
,
5586
(
2009
).
7.
S.
Braun
 et al.,
Adv. Mater. (Weinheim, Ger.)
21
,
1450
(
2009
).
8.
T. J.
Richards
and
H.
Sirringhaus
,
J. Appl. Phys.
102
,
094510
(
2007
).
9.
P. V.
Pesavento
 et al.,
J. Appl. Phys.
96
,
7312
(
2004
).
10.
S. P.
Tiwari
 et al.,
J. Appl. Phys.
106
,
054504
(
2009
).
11.
X.
Cheng
 et al.,
Adv. Funct. Mater.
19
,
2407
(
2009
).
12.
H.
Yan
 et al.,
Nature (London)
457
,
679
(
2009
).
13.
Z.
Chen
 et al.,
J. Am. Chem. Soc.
131
,
8
(
2009
).
14.
S.
Luan
and
G. W.
Neudeck
,
J. Appl. Phys.
72
,
766
(
1992
).
15.
D.
Natali
 et al.,
J. Appl. Phys.
101
,
014501
(
2007
).
16.
J. -F.
Chang
 et al.,
Adv. Funct. Mater.
(to be published).
17.

Due to L dependence of RC0, gTLM is strictly not applicable, even though the error is limited on the shortest channels where the total resistance is dominated by the gateable part. Since Rc0 is assumed to be VG-independent in DM, its dependence on L can be unambiguously attributed to a dependence on the electric field. VT dependence on L only affects the gate-voltage dependent term. In our case VT was equal to 12 V, 14.5 V, and 15.3 V for L=6.5μm, 11.5μm, and 21.5μm, respectively. Likely due to short channel effects, the DM method could not be applied for L=3.5μm

18.
R. J.
Chesterfield
 et al.,
J. Appl. Phys.
95
,
6396
(
2004
).
19.
C. -S.
Chiang
 et al.,
Jpn. J. Appl. Phys., Part 1
37
,
5914
(
1998
).
20.
N. F.
Mott
and
R. W.
Gurney
,
Electronic Processes in Ionic Crystals
(
Oxford University Press
,
London
,
1940
).
You do not currently have access to this content.