We combine the extended finite element method with simulations of diffracted x-ray intensities to investigate the diffusely scattered intensity due to dislocations. As a model system a thin PbSe epitaxial layer grown on top of a PbTe buffer on a CdTe substrate was chosen. The PbSe film shows a periodic dislocation network where the dislocations run along the orthogonal directions. The array of dislocations within this layer can be described by a short range order model with a narrow distribution.
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Since the dislocation distances can take only positive values a Poisson distribution would be more natural. However, since in our case is much smaller then the mean distance a Gaussian distribution gives virtually the same results.
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2010
American Institute of Physics
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