The thermal conductivity of an epitaxial layer of grown by pulsed-laser deposition is measured by time-domain thermoreflectance in the temperature range . Characterization by x-ray diffraction and cross-sectional transmission electron microscopy show that the sample has the structure of the Dion–Jacobson series of phases. The conductivity of this layered oxide is of the predicted minimum thermal conductivity in this temperature range; the thermal conductivity at room temperature, , is comparable to the lowest conductivity ever observed in an oxide crystal.
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