Evolution of infrared photoreflectance lineshape with temperature in narrow-gap HgCdTe epilayers

Temperature-dependent $(11–290K)$ infrared photoreflectance (PR) measurements are performed on as-grown arsenic-doped HgCdTe epilayers in a midinfrared spectral region. Main PR features near bandedge manifest clear evolution of lineshape with temperature, of which the fittings identify besides a band-band process several below-gap processes. Analyses show that these features are due to photomodulation-induced screening of donor-acceptor pairs and photomodulation of band- impurity and band-band reflectance, their intensities correlate to the joint concentration of the involved energetic states. Temperature-dependent infrared PR may be a right optical spectroscopy for identifying impurity levels in semiconductors such as HgCdTe with high-density impurities.