We demonstrate an evanescent field modality for terahertz frequency time-domain measurements, based on the interaction between a sample and the evanescent field extending above lithographically defined terahertz waveguides. We quantify this interaction using freely positionable dielectric samples (GaAs) moved in close proximity to the waveguide (a terahertz microstrip line), finding a reduction in the microstrip-propagating pulse amplitude and an increase in its time delay when the dielectric is brought into the microstrip evanescent field. We also show that the frequency response of resonant passive circuit elements (stub band-stop filters), integrated into the microstrip line, can be used to determine the terahertz frequency properties of scanned samples, opening the way for a terahertz subwavelength imaging modality, the resolution of which is limited by lithographic constraints, rather than by free-space diffraction.
Skip Nav Destination
Article navigation
21 January 2008
Research Article|
January 23 2008
Terahertz evanescent field microscopy of dielectric materials using on-chip waveguides
J. Cunningham;
J. Cunningham
a)
School of Electronic and Electrical Engineering,
University of Leeds
, Leeds LS2 9JT, United Kingdom
Search for other works by this author on:
M. Byrne;
M. Byrne
School of Electronic and Electrical Engineering,
University of Leeds
, Leeds LS2 9JT, United Kingdom
Search for other works by this author on:
P. Upadhya;
P. Upadhya
School of Electronic and Electrical Engineering,
University of Leeds
, Leeds LS2 9JT, United Kingdom
Search for other works by this author on:
M. Lachab;
M. Lachab
School of Electronic and Electrical Engineering,
University of Leeds
, Leeds LS2 9JT, United Kingdom
Search for other works by this author on:
E. H. Linfield;
E. H. Linfield
School of Electronic and Electrical Engineering,
University of Leeds
, Leeds LS2 9JT, United Kingdom
Search for other works by this author on:
A. G. Davies
A. G. Davies
School of Electronic and Electrical Engineering,
University of Leeds
, Leeds LS2 9JT, United Kingdom
Search for other works by this author on:
a)
Electronic mail: [email protected].
Appl. Phys. Lett. 92, 032903 (2008)
Article history
Received:
August 13 2007
Accepted:
December 24 2007
Citation
J. Cunningham, M. Byrne, P. Upadhya, M. Lachab, E. H. Linfield, A. G. Davies; Terahertz evanescent field microscopy of dielectric materials using on-chip waveguides. Appl. Phys. Lett. 21 January 2008; 92 (3): 032903. https://doi.org/10.1063/1.2835705
Download citation file:
Pay-Per-View Access
$40.00
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Citing articles via
Roadmap on photonic metasurfaces
Sebastian A. Schulz, Rupert. F. Oulton, et al.
Sputter epitaxy of ScAlN films on GaN high electron mobility transistor structures
Tomoya Okuda, Shunsuke Ota, et al.
Era of entropy: Synthesis, structure, properties, and applications of high-entropy materials
Christina M. Rost, Alessandro R. Mazza, et al.
Related Content
Terahertz vibrational absorption spectroscopy using microstrip-line waveguides
Appl. Phys. Lett. (November 2008)
An improved ultra-wideband bandpass filter design using split ring resonator with coupled microstrip line
AIP Conference Proceedings (April 2018)
Multiple-frequency terahertz pulsed sensing of dielectric films
Appl. Phys. Lett. (February 2006)
Tuning and widening of stop bands of microstrip photonic band gap ring structures
Appl. Phys. Lett. (April 2005)
Triple-band high-temperature superconducting microstrip filter based on multimode split ring resonator
Appl. Phys. Lett. (October 2013)