Phase change random access memory (PRAM) is unique among semiconductor devices because heat is intrinsic to the operation of the device, not just a by-product. Here, we apply a material that is exotic in the context of typical semiconductor devices but has highly desirable properties for PRAM. Thin films of are semiconducting and show very low thermal conductance. By inserting a layer between the phase change material and the metal electrode, we dramatically reduced the heat dissipation and, thereby, the operating current. A PRAM device incorporating a layer operated stably for more than .
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