Microfabrication of graphene devices used in many experimental studies currently relies on the fact that graphene crystallites can be visualized using optical microscopy if prepared on top of Si wafers with a certain thickness of SiO2. The authors study graphene’s visibility and show that it depends strongly on both thickness of SiO2 and light wavelength. They have found that by using monochromatic illumination, graphene can be isolated for any SiO2 thickness, albeit 300nm (the current standard) and, especially, 100nm are most suitable for its visual detection. By using a Fresnel-law-based model, they quantitatively describe the experimental data.

1.
K. S.
Novoselov
,
A. K.
Geim
,
S. V.
Morozov
,
D.
Jiang
,
Y.
Zhang
,
S. V.
Dubonos
,
I. V.
Grigorieva
, and
A. A.
Firsov
,
Science
306
,
666
(
2004
).
2.
A. K.
Geim
and
K. S.
Novoselov
,
Nat. Mater.
6
,
183
(
2007
).
3.
A. H.
Castro Neto
,
F.
Guinea
, and
N. M. R.
Peres
,
Phys. World
19
,
33
(
2007
).
4.
Y.
Zhang
,
J. W.
Tan
,
H. L.
Stormer
, and
P.
Kim
,
Nature (London)
438
,
201
(
2005
).
5.
K. S.
Novoselov
,
D.
Jiang
,
F.
Schedin
,
T. J.
Booth
,
V. V.
Khotkevich
,
S. V.
Morozov
, and
A. K.
Geim
,
Proc. Natl. Acad. Sci. U.S.A.
102
,
10451
(
2005
).
6.
H.
Petroski
,
The Pencil: A History of Design and Circumstance
(
Knopf
,
New York
,
1989
), Chap. 4, pp.
36
47
.
7.
A. C.
Ferrari
,
J. C.
Meyer
,
V.
Scardaci
,
C.
Casiraghi
,
M.
Lazzeri
,
F.
Mauri
,
S.
Piscanec
,
D.
Jiang
,
K. S.
Novoselov
,
S.
Roth
, and
A. K.
Geim
,
Phys. Rev. Lett.
97
,
187401
(
2006
).
8.

Filtered light images are taken with a Nikon DS-2MBWc monochrome camera. White light images are taken with a Nikon DS-2Mv color camera. Cheaper cameras are more likely to do extensive postprocessing of images in firmware or software that could enhance contrast.

9.
Handbook of Optical Constants of Solids
, edited by
E. D.
Palik
(
Academic
,
New York
,
1991
),
2
, pp.
457
458
.
10.
J.
Henrie
,
S.
Kellis
,
S.
Schultz
, and
A.
Hawkins
,
Opt. Express
12
,
1464
(
2004
).
11.
Linus
Pauling
,
The Nature of the Chemical Bond
(
Cornell University Press
,
Ithaca
,
1960
), Chap. 7, pp.
234
235
.
12.

In Ref. 9, the refractive index of bulk graphite is within 5% of 2.61.3i between 300 and 590nm. At 630nm, the extinction coefficient jumps to 1.73, but this coincides with a change of reference in the handbook, which we have chosen to ignore in our model.

13.
H.
Anders
,
Thin Films in Optics
(
Focal
,
London
,
1967
), Pt. 1, pp.
18
48
.
14.

The experimental contrast was found by computer analysis of the images obtained using a monochrome camera Ref. 8. The thickness of SiO2 usually differs by up to 5% from nominal values provided by suppliers and, accordingly, in our theoretical calculations in Fig. 2, the following values for d2 were used to acheive the best fit: (a) 290nm, (b) 190nm, and (c) 88nm.

15.
I.
Jung
,
M.
Pelton
,
R.
Piner
,
D. A.
Dikin
,
S.
Stankovich
,
S.
Watcharotone
,
M.
Hausner
, and
R. S.
Ruoff
, e-print arXiv:cond-mat/0706.0029.
16.
C.
Casiraghi
,
A.
Hartschuh
,
E.
Lidorikis
,
H.
Qian
,
H.
Harutyunyan
,
T.
Gokus
,
K. S.
Novoselov
, and
A. C.
Ferrari
, e-print arXiv:cond-mat/0705.2645.
17.
D. S. L.
Abergel
,
A.
Russell
, and
V. I.
Fal’ko
, e-print arXiv:cond-mat/0705.0091.
18.
S.
Roddaro
,
P.
Pingue
,
V.
Piazza
,
V.
Pellegrini
, and
F.
Beltram
, e-print arXiv:cond-mat/0705.0492.
You do not currently have access to this content.