Silicon crystals were shock compressed along the  and  orientations to stresses between 15.9 and . Transmitted wave profiles exhibited considerable orientation dependence for elastic and inelastic waves but very little orientation dependence for the phase transformation wave. Following the phase transformation wave, the silicon was compressed . This compression is significantly greater than the previously reported compressions for silicon shocked to similar stresses, and the present data are consistent with a completed phase transformation. The measured mechanical impedance of the transformed silicon matches the bulk impedance of the simple hexagonal phase of silicon reported in static high pressure studies.
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Research Article| November 14 2007
Inelastic deformation and phase transformation of shock compressed silicon single crystals
Stefan J. Turneaure;
Stefan J. Turneaure, Y. M. Gupta; Inelastic deformation and phase transformation of shock compressed silicon single crystals. Appl. Phys. Lett. 12 November 2007; 91 (20): 201913. https://doi.org/10.1063/1.2814067
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