This letter reports contact potential measurement between the tip of a heated atomic force microscope cantilever and a biased gold film. Force-distance experiments were performed with tip temperature, tip potential, and substrate potential independently controlled. Experiments were conducted for probe temperatures of 23 to 200 °C and tip potentials of −1 V to 1 V. The measured contact potential was a function of temperature, due to the thermoelectric properties of the tip and substrate. The Seebeck coefficient for the combined system was close to 4.30mVK, consistent with the tip and substrate materials. The technique is scalable to arrays suitable for large area imaging.

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