This letter reports contact potential measurement between the tip of a heated atomic force microscope cantilever and a biased gold film. Force-distance experiments were performed with tip temperature, tip potential, and substrate potential independently controlled. Experiments were conducted for probe temperatures of 23 to 200 °C and tip potentials of −1 V to 1 V. The measured contact potential was a function of temperature, due to the thermoelectric properties of the tip and substrate. The Seebeck coefficient for the combined system was close to , consistent with the tip and substrate materials. The technique is scalable to arrays suitable for large area imaging.
Contact potential measurement using a heated atomic force microscope tip
Jessica L. Remmert, Yan Wu, Jungchul Lee, Mark A. Shannon, William P. King; Contact potential measurement using a heated atomic force microscope tip. Appl. Phys. Lett. 1 October 2007; 91 (14): 143111. https://doi.org/10.1063/1.2789927
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