Magnetoelectric coupling of $[00l]$-oriented $Pb(Zr0.4Ti0.6)O3–Ni0.8Zn0.2Fe2O4$ multilayered thin films

Multilayered thin films consisting of alternatively stacking $Pb(Zr0.4Ti0.6)O3$ (PZT) and $Ni0.8Zn0.2Fe2O4$ (NZFO) layers were fabricated to exploit a strain-mediated coupling of piezoelectricity and magnetostriction. The $450-nm$-thick PZT/NZFO multilayer fabricated by pulsed laser deposition showed magnetodielectric effects upon applying a static magnetic field. The magnetoelectric (ME) susceptibility values estimated using these magnetodielectric responses were in the range of $15–30mV∕cmOe$ at a zero magnetic-field strength and were comparable to those obtained using a more commonly employed “dynamic” ME method.