Edge-to-edge interprecipitate distance distributions are critical for predicting precipitation strengthening of alloys and other physical phenomena. A method to calculate this three-dimensional distance and the two-dimensional interplanar distance from atom-probe tomographic data is presented. It is applied to nanometer-sized Cu-rich precipitates in an Cu alloy. Experimental interprecipitate distance distributions are discussed.
© 2007 American Institute of Physics.
2007
American Institute of Physics
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