Thin crystalline films of are grown on an atomically flat Ge(001) surface by molecular beam epitaxy and are characterized in situ by reflection high energy electron diffraction and x-ray photoelectron spectroscopy, and ex situ by x-ray diffraction (XRD), atomic force microscopy (AFM), and transmission electron microscopy. The first stage of the growth corresponds to a cubic (110) structure, with two equiprobable, 90° rotated, in-plane domains. Increasing the thickness of the films, a phase transition from cubic (110) to monoclinic (100) oriented crystallites is observed which keeps the in-plane domain rotation, as evidenced by XRD and AFM.
REFERENCES
1.
Rare Earth Oxide Thin films: Growth, Characterization and Applications
, edited by M.
Fanciulli
and G.
Scarel
(Springer
, Heidelberg
, 2007
), 106
, pp. 1
–14
, and references therein.2.
R. A.
McKee
, F. J.
Walker
, and M. F.
Chisholm
, Phys. Rev. Lett.
81
, 3014
(1998
).3.
P. W.
Peacock
and J.
Robertson
, J. Appl. Phys.
92
, 4712
(2002
).4.
M.
Hong
, J.
Kwo
, A. R.
Kortan
, J. P.
Mannaerts
, and A. M.
Sergent
, Science
283
, 1897
(1999
).5.
A.
Laha
, H. J.
Osten
, and A.
Fissel
, Appl. Phys. Lett.
89
, 143514
(2006
).6.
M.
Czernohorsky
, E.
Bugiel
, H. J.
Osten
, A.
Fissel
, and O.
Kirfel
, Appl. Phys. Lett.
88
, 152905
(2006
).7.
R. A.
McKee
, F. J.
Walker
, M.
Buongiorno Nardelli
, W. A.
Shelton
, and G. M.
Stocks
, Science
283
, 1897
(1999
).8.
H.
Shang
, M. M.
Frank
, E. P.
Gusev
, J. O.
Chu
, S. W.
Bedell
, K. W.
Guarini
, and M.
Ieong
, IBM J. Res. Dev.
50
, 377
(2006
).9.
A.
Molle
, M. N. K.
Bhuiyan
, G.
Tallarida
, and M.
Fanciulli
, Appl. Phys. Lett.
89
, 083504
(2006
).10.
W. J.
Lademan
, A. K.
See
, L. B.
Klebanoff
, and G.
Van der Laan
, Phys. Rev. B
54
, 17191
(1996
).11.
J. A.
Gupta
, D.
Landheer
, G. I.
Sproule
, J. P.
Caffrey
, M. J.
Graham
, K.-C.
Yang
, Z.-H.
Lu
, and W. N.
Lennard
, Appl. Phys. Lett.
78
, 1718
(2001
).12.
P.
Terzieff
and K.
Lee
, J. Appl. Phys.
50
, 3565
(1979
).13.
14.
Inorganic Crystal Structure Database
, files 96207, Fachinformationzentrum Karlsruhe, 2005
.15.
O. J.
Guentert
and R. L.
Mozzi
, Acta Crystallogr.
11
, 746
(1958
).16.
P. F.
Fewster
, X-ray Scattering from Semiconductor
(Imperial College Press
, London
, 2000
), p. 18
.© 2007 American Institute of Physics.
2007
American Institute of Physics
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