Samples of , amorphous C, chemical-vapor-deposition-diamond C, Si, and SiC were exposed to single long pulses of free-electron-laser radiation at fluences of up to . The samples were chosen as candidate materials for x-ray free-electron-laser optics. It was found that the threshold for surface damage is on the order of the fluence required for thermal melting. For larger fluences, the crater depths correspond to temperatures on the order of the critical temperature, suggesting that the craters are formed by two-phase vaporization.
REFERENCES
1.
National Technical Information Service Report No. SLAC-R-521,
1998
(unpublished).2.
F.
Richard
, J. R.
Schneider
, D.
Trines
, and A.
Wagner
, report, 2001
(DESY 2001-001), http://tesla.desy.de/new_pages/TDR_CD/start.html3.
R.
Tatchyn
, J.
Arthur
, R.
Boyce
, T.
Cremer
, A.
Fasso
, J.
Montgomery
, V.
Vylet
, D.
Walz
, R.
Yotam
, A. K.
Freund
, and M. R.
Howells
, Proc. SPIE
3154
, 174
(1998
).4.
R.
Bionta
, LCLS Technical Note LCLS-TN-00–3 (unpublished), http://www-ssrl.slac.stanford.edu/lcls/technotes/5.
R. A.
London
, R. M.
Bionta
, R. O.
Tatchyn
, and S.
Roesler
, Proc. SPIE
4500
, 51
(2001
).6.
A.
Wootton
, J.
Arthur
, T.
Barbee
, R.
Bionta
, R.
London
, H.-S.
Park
, D.
Ryutov
, E.
Spiller
, and R.
Tatchyn
, Proc. SPIE
4500
, 113
(2001
).7.
D. D.
Ryutov
, Rev. Sci. Instrum.
74
, 3722
(2003
).8.
L.
Juha
, M.
Bittner
, M.
De Grazia
, J.
Feldhaus
, J.
Gaudin
, S.
Guizard
, S.
Jacobi
, M.
Kozlová
, J.
Krása
, J.
Krzywinski
, H.
Merdji
, C.
Michaelsen
, T.
Mocek
, R.
Nietubyc
, M.
Jurek
, J.
Polan
, A. R.
Präg
, B.
Rus
, R.
Sobierajski
, B.
Steeg-Keitel
, M.
Störmer
, M.
Stupka
, V.
Vorlíček
, J.
Wiesmann
, and J.
Wild
, Proc. SPIE
5917
, 91
(2005
).9.
FLASH was formerly known as VUV-FEL and TTF2 FEL. See http://vuv-fel.desy.de and references therein.
10.
M.
Richter
, A.
Gottwald
, U.
Kroth
, A. A.
Sorokin
, S. V.
Bobashev
, L. A.
Shmaenok
, J.
Feldhaus
, Ch.
Gerth
, B.
Steeg
, K.
Tiedtke
, and R.
Treusch
, Appl. Phys. Lett.
83
, 2970
(2003
)11.
M.
Störmer
, A.
Liard-Cloup
, F.
Felten
, S.
Jacobi
, B.
Steeg
, J.
Feldhaus
, and R.
Bormann
, Proc. SPIE
5533
, 58
(2004
).12.
We used the ZYGO white light interferometer fabricated by ZYGO Corp., Middlefield, CT.
13.
14.
A.
Rousse
, C.
Rischel
, S.
Fourmaux
, I.
Uschmann
, S.
Sebban
, G.
Grillon
, Ph.
Balcou
, E.
Foerster
, J. P.
Geindre
, P.
Audebert
, J. C.
Gauthier
, and D.
Hulin
, Nature (London)
410
, 65
(2001
).15.
NIST Chemistry WebBook
, NIST Standard Reference Database Number 69
, edited by P. J.
Lintstrom
and W. G.
Mallard
June 2005
, National Institute of Standards and Technology
, Gaithersburg MD, 20899 (http://webbook.nist.gov).16.
B. L.
Henke
, E. M.
Gullikson
, and J. C.
Davis
, At. Data Nucl. Data Tables
54
, 181
(1993
).17.
J.
Krzywinski
(unpublished).18.
R. M.
More
, K. H.
Warren
, D. A.
Young
, and G. B.
Zimmerman
, Phys. Fluids
31
, 3059
(1988
).19.
M. M.
Martynyuk
, Sov. Phys. Tech. Phys.
19
, 793
(1974
).20.
K.
Sokolowski-Tinten
, C.
Blome
, C.
Dietrich
, A.
Tarasevitch
, M.
Horn von Hoegen
, D.
von der Linde
, A.
Cavalleri
, J.
Squier
, and M.
Kammler
, Phys. Rev. Lett.
87
, 225701
(2001
).© 2007 American Institute of Physics.
2007
American Institute of Physics
You do not currently have access to this content.