Self-heating effects are investigated in polycrystalline silicon thin film transistors by combining experimental measurements and two-dimensional numerical simulations. From the thermodynamic model the temperature distribution was extracted and found rather uniform along the channel. This allowed the authors to introduce a simplified method to determine the channel temperature when the device is affected by self-heating effects.
REFERENCES
1.
T.
Motai
, Digest of Technical Paper of the International Workshop on Active-Matrix Liquid-Crystal Displays
(Tokyo
, 2002
) (unpublished), p. 21
.2.
R. S.
Sposili
and J. S.
Im
, Appl. Phys. Lett.
69
, 2864
(1996
).3.
L. J.
McDaid
, S.
Hall
, P. H.
Mellor
, and W.
Ecclestone
, Electron. Lett.
25
, 827
(1989
).4.
L. T.
Su
, J. E.
Chung
, A.
Antoniadis
, K. E.
Goodson
, and M. I.
Flik
, IEEE Trans. Electron Devices
41
, 69
(1994
).5.
M.
Koyanagi
, T.
Shimatani
, M.
Tsuno
, T.
Matsumoto
, N.
Kato
, and S.
Yamada
, Tech. Dig. - Int. Electron Devices Meet.
1993
, 97
.6.
S.
Inoue
, H.
Ohshima
, and T.
Shimoda
, Jpn. J. Appl. Phys., Part 1
41
, 6313
(2002
).7.
Y.
Uraoka
, K.
Kitajima
, H.
Kirimura
, H.
Yano
, T.
Hatayama
, and T.
Fuyuki
, Jpn. J. Appl. Phys., Part 1
44
, 2895
(2005
).8.
S. D.
Brotherton
, M. A.
Crowder
, A. B.
Limanov
, B.
Turk
, and J. S.
Im
, Proceedings of the Asia Display∕IDW’01
(2001
) (unpublished), p. 387
.9.
A.
Bonfiglietti
, A.
Valletta
, P.
Gaucci
, L.
Mariucci
, G.
Fortunato
, and S. D.
Brotherton
, J. Appl. Phys.
98
, 033702
(2005
).10.
Synopsys Inc., 700 East Middlefield Road Mountain View, CA 94043, URL: http://synopsys.com/
© 2006 American Institute of Physics.
2006
American Institute of Physics
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