Probe-typed carbon nanotube (CNT) point emitter was fabricated by attaching single-walled CNT (SWCNT) and double-walled CNT (DWCNT) bundles onto the atomic force microscope tip using dielectrophoresis method. The field emission current from SWCNT point emitter was at , which is corresponding to the emission current density of at least . The Fowler-Nordheim plots for the SWCNT and DWCNT point emitters revealed that the SWCNT bundle consists of more individual SWCNTs than DWCNT bundle and, as a result, the field emission performance of the SWCNT point emitter is better than the DWCNT point emitter. It is suggested that the probe-typed CNT point emitters can be used for microwave amplifiers and high-resolution electron-beam instruments.
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