Microstructure and enhanced in-plane ferroelectricity of $Ba0.7Sr0.3TiO3$ thin films grown on $MgAl2O4$ (001) single-crystal substrate Available to Purchase

The microstructure and in-plane dielectric and ferroelectric properties of highly oriented $Ba0.7Sr0.3TiO3$ (BST) thin film grown on $MgAl2O4$ (001) single-crystal substrate through pulsed laser deposition were investigated. X-ray diffraction measurements indicated that BST had a distorted lattice with a tetragonality $a∕c=1.012$⁠. The cross-sectional observation under transmission electron microscope revealed that, while most of BST grains grew epitaxially on $MgAl2O4$⁠, the film also contained a noticeable amount of misoriented grains and dislocations. The electrical measurements indicated that the film had a shifted Curie temperature $(TC=78°C)$ and an enhanced in-plane ferroelectricity (remnant polarization $Pr=7.1μC∕cm2$⁠) when compared with BST ceramic (⁠$TC≈33°C$ and $Pr≈0$⁠).