To investigate the effects of metal penetration into organic semiconductors on the electrical properties of organic thin film transistors, gold was deposited onto pentacene films at various deposition rates. The sharp interface between the gold electrode and the pentacene film that results from a fast deposition rate was found to produce lower contact resistance and an increase in the field-effect mobility.
REFERENCES
1.
W. F.
Aerts
, S.
Verlaak
, and P.
Heremans
, IEEE Trans. Electron Devices
49
, 2124
(2002
).2.
H.
Klauk
, M.
Halik
, U.
Zschieschang
, G.
Schmid
, and W.
Radlik
, J. Appl. Phys.
92
, 5259
(2002
).3.
P. V.
Pesavento
, R. J.
Chesterfield
, C. R.
Newman
, and C. D.
Frisbie
, J. Appl. Phys.
96
, 7312
(2004
).4.
J.
Xue
, and S. R.
Forrest
, Appl. Phys. Lett.
82
, 136
(2003
).5.
J. H.
Cho
, Y. D.
Park
, D. H.
Kim
, W.-K.
Kim
, H. W.
Jang
, J.-L.
Lee
, and K.
Cho
, Appl. Phys. Lett.
88
, 102104
(2006
).6.
H.
Ishii
, K.
Sugiyama
, E.
Ito
, and K.
Seki
, Adv. Mater. (Weinheim, Ger.)
11
, 605
(1999
).7.
Y.
Hirose
, A.
Kahn
, V.
Aristov
, P.
Soukiasian
, V.
Bulovic
, and S. R.
Forrest
, Phys. Rev. B
54
, 13748
(1996
).8.
A. C.
Dürr
, F.
Schreiber
, M.
Kelsch
, H. D.
Carstanjen
, and H.
Dosch
, Adv. Mater. (Weinheim, Ger.)
14
, 961
(2002
).9.
A. C.
Dürr
, F.
Schreiber
, M.
Kelsch
, H. D.
Carstanjen
, H.
Dosch
, and O. H.
Seeck
, J. Appl. Phys.
93
, 5201
(2003
).10.
C. D.
Dimitrakopoulos
and P. R. L.
Malenfant
, Adv. Mater. (Weinheim, Ger.)
14
, 99
(2002
).11.
Y.
Wu
, P.
Liu
, B. S.
Ong
, T.
Srikumar
, N.
Zao
, G.
Botton
, and S.
Zhu
, Appl. Phys. Lett.
86
, 142102
(2005
).12.
R.
Tromp
, F.
LeGoues
, and P.
Ho
, J. Vac. Sci. Technol. A
3
, 782
(1985
).13.
F.
Faupel
, R.
Willecke
, and A.
Thran
, Mater. Sci. Eng., R.
22
, 1
(1998
).14.
J.
Zaumeseil
, K. W.
Baldwin
, and J. A.
Rogers
, J. Appl. Phys.
93
, 6117
(2003
).15.
S.
Luan
and G. W.
Neudeck
, J. Appl. Phys.
72
, 766
(1992
).16.
G.
Beernink
, T.
Strunskus
, G.
Witte
, and Ch.
Wöll
, Appl. Phys. Lett.
85
, 398
(2004
).17.
Y. J.
Hsu
, W. S.
Hu
, D. H.
Wei
, Y. S.
Wi
, and Y. T.
Tao
, J. Electron Spectrosc. Relat. Phenom.
144
, 401
(2005
).© 2006 American Institute of Physics.
2006
American Institute of Physics
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