We are able to fabricate both polycrystalline and amorphous indium zinc oxide thin films. All the thin films exhibited an -type semiconductor behavior with room-temperature conductivities in the range of . A nanoscaled conductivity inhomogeneity was observed in polycrystalline films by means of conducting atomic force microscopy, with morphology effect excluded by simultaneous topographic mapping. This effect has been explained in the presence of highly conducting and nano crystalline phases imbedded in amorphous matrix. On the other hand, excellent electrical homogeneity throughout the amorphous film was observed, suggesting its promising potential in microelectronic device applications.
REFERENCES
1.
K.
Nomura
, H.
Ohta
, A.
Takagi
, T.
Kamiya
, M.
Hirano
, and H.
Hosono
, Nature (London)
432
, 488
(2004
).2.
H. Q.
Chiang
, J. F.
Wager
, R. L.
Hoffman
, J.
Jeong
, and D. A.
Keszler
, Appl. Phys. Lett.
86
, 013503
(2005
).3.
N. L.
Dehuff
, E. S.
Kettenring
, D.
Hong
, H. Q.
Chiang
, J. F.
Wager
, R. L.
Hoffman
, C. H.
Park
, and D. A.
Keszler
, J. Appl. Phys.
97
, 064505
(2005
).4.
J. R.
Bellingham
, W. A.
Philips
, and C. J.
Adkins
, J. Phys.: Condens. Matter
2
, 6207
(1990
).5.
B.
Pashmakov
, B.
Claflin
, and H.
Fritzcshe
, Solid State Commun.
86
, 619
(1993
).6.
A. J.
Nozik
, Phys. Rev. B
6
, 453
(1972
).7.
M.
Yasukawa
, H.
Hosono
, N.
Ueda
, and H.
Kawadaoe
, Jpn. J. Appl. Phys., Part 2
34
, L281
(1995
).8.
H.
Hosono
, N.
Kikuchi
, N.
Ueda
, and H.
Kawazoe
, Appl. Phys. Lett.
67
, 2663
(1995
).9.
S.
Narushima
, O.
Masahiro
, H.
Masahiro
, and H.
Hosono
, Phys. Rev. B
66
, 035203
(2002
).10.
H.
Hosono
, Y.
Yamashita
, N.
Ueda
, H.
Kawazoe
, and K.
Shimidzu
, Appl. Phys. Lett.
68
, 661
(1996
).11.
M.
Orita
, H.
Ohta
, M.
Hirano
, S.
Narushima
, and H.
Hosono
, Philos. Mag. B
81
, 501
(2000
).12.
C. R.
Kagan
and P.
Andry
, Thin-Film Transistors
(Dekker
, New York, 2003
).13.
14.
J.
Cui
, A.
Wang
, N. L.
Edleman
, J.
Ni
, P.
Lee
, N. R.
Armstrong
, and T. J.
Marks
, Adv. Mater. (Weinheim, Ger.)
31
, 1476
(2001
).15.
J. M.
Philips
, R. J.
Cava
, G. A.
Thomas
, S. A.
Carter
, J.
Kwo
, T.
Siegrist
, J. J.
Krajeski
, J. H.
Marshall
, W. F.
Peck
, Jr., and D. H.
Rapkin
, Appl. Phys. Lett.
67
, 2246
(1995
).16.
B.
Kumar
, H.
Gong
, and R.
Akkideppi
, J. Appl. Phys.
98
, 073703
(2005
).17.
JCPDS
, International Centre for Diffraction Data, PDF file No. 20-1442, structure-Hexagonal (1998
).18.
J. M.
Philips
, R. J.
Cava
, G. A.
Thomas
, S. A.
Carter
, J.
Kwo
, T.
Siegrist
, J. J.
Krajeski
, J. H.
Marshall
, W. F.
Peck
, Jr., and D. H.
Rapkin
, Appl. Phys. Lett.
67
, 2246
(1995
).19.
T.
Minami
, H.
Sonohara
, T.
Kakumu
, and S.
Takata
, Jpn. J. Appl. Phys., Part 2
34
, 971
(1995
).© 2006 American Institute of Physics.
2006
American Institute of Physics
You do not currently have access to this content.