Growth and properties of (104)-oriented ferroelectric Nd-substituted $Bi4Ti3O12$ films on Si(100) using (111)-oriented $SrRuO3∕Pt$ electrodes

(104)-oriented Nd-substituted $Bi4Ti3O12$ (BNT) ferroelectric thin films were grown on (111)-oriented $SrRuO3∕Pt$ electrodes on yttria-stabilized $ZrO2$ (YSZ)-buffered Si(100) substrates by pulsed laser deposition. X-ray diffraction characterization revealed the epitaxial orienta-tion relationships as follows: $BNT(104)‖SrRuO3(111)‖Pt(111)‖YSZ(100)‖Si(100)$⁠; $BNT[010]‖SrRuO3[01¯1]‖Pt[01¯1]‖YSZ⟨001⟩‖Si⟨001⟩$⁠. The BNT films exhibited a remanent polarization $(2Pr)$ of $37.8μC∕cm2$ and a coercive field $(2Ec)$ of $212kV∕cm$⁠, for a maximum applied electric field of $300kV∕cm$⁠.