Polyimide films for a homeotropic alignment are treated by a microrubbing process using a tiny metal ball ( diameter). During the microrubbing, a vertical load and frictional force are simultaneously measured. Pretilt angles of fabricated liquid crystal cells are determined by measuring retardations using a polarizing microscope. Relationships between the pretilt angle and the frictional force or a frictional work are investigated. Controllability of the pretilt angles in side- and main-chain-type polyimides is discussed. Microscopic mechanism of the decrease of the pretilt angle by the rubbing treatment is discussed and the insight into the roles of the side and main chain is described.
REFERENCES
1.
R. W.
Filas
and J. S.
Patel
, Appl. Phys. Lett.
50
, 1426
(1987
).2.
K.-Y.
Han
, P.
Vetter
, and T.
Uchida
, Jpn. J. Appl. Phys., Part 2
32
, L1242
(1993
).3.
H.
Hatoh
, K.
Shohara
, Y.
Kinoshita
, and N.
Ookoshi
, Appl. Phys. Lett.
63
, 3577
(1993
).4.
C.
Nozaki
, N.
Imamura
, and Y.
Sano
, Jpn. J. Appl. Phys., Part 1
32
, 4352
(1993
).5.
S.
Furumi
, M.
Nakagawa
, S.
Morino
, and K.
Ichimura
, Appl. Phys. Lett.
74
, 2438
(1999
).6.
B.
Park
, K.-J.
Han
, Y.
Jung
, H.-H.
Choi
, H.-K.
Hwang
, S.
Lee
, S.-H.
Jang
, and H.
Takezoe
, J. Appl. Phys.
86
, 1854
(1999
).7.
G. P.
Sinha
, B.
Wen
, and C.
Rosenblatt
, Appl. Phys. Lett.
79
, 2543
(2001
).8.
M.
Honma
and T.
Nose
, Jpn. J. Appl. Phys., Part 2
43
, L855
(2004
).9.
M.
Honma
and T.
Nose
, Appl. Opt.
43
, 5193
(2004
).10.
11.
N.
Chen
, A.
Suzuki
, A.
Inada
, and K.
Kato
, Mol. Cryst. Liq. Cryst. Sci. Technol., Sect. A
368
, 581
(2001
).12.
M.
Honma
and T.
Nose
, Jpn. J. Appl. Phys., Part 1
42
, 6992
(2003
).13.
M.
Honma
, K.
Yamamoto
, and T.
Nose
, J. Appl. Phys.
96
, 5415
(2004
).14.
S.
Varghese
, G. P.
Crawford
, C. W. M.
Bastiaansen
, D. K. G.
de Boer
, and D. J.
Broer
, Appl. Phys. Lett.
85
, 230
(2004
).15.
E.
Meyer
, R.
Overney
, K.
Dransfeld
, and T.
Gyalog
, Nanoscience: Friction and Rheology on the Nanometer Scale
(World Scientific
, Singapore, 1998
), Chap. 2, p. 65
.16.
D.-S.
Seo
, K.
Araya
, N.
Yoshida
, M.
Nishikawa
, Y.
Yabe
, and S.
Kobayashi
, Jpn. J. Appl. Phys., Part 2
34
, L503
(1995
).17.
D.
Andrienko
, Y.
Kurioz
, Y.
Reznikov
, C.
Rosenblatt
, R. G.
Petschek
, O. D.
Lavrentovich
, and D.
Sebacius
, J. Appl. Phys.
83
, 50
(1998
).18.
Z.
Huang
and C.
Rosenblatt
, Appl. Phys. Lett.
86
, 011908
(2005
).© 2006 American Institute of Physics.
2006
American Institute of Physics
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