We study current transport across a heterojunction (HJ) modulated by the filtering action of the ferromagnetic semiconductor EuS in zero external magnetic field. Analysis of the current-voltage (I-V) characteristics of the current injected from EuS into GaAs across the HJ yields a value for the Zeeman splitting of the EuS conduction band of at 5 K. The change in the barrier height at the HJ mimics the change of the spontaneous magnetization of EuS, i.e., it has Brillouin like characteristics with a of 17 K. Utilizing the experimentally obtained values for the Zeeman splitting as input parameters, we analyze the I-V characteristics for unpolarized electrons injected from GaAs, to estimate the polarization detection efficiency as a function of bias and temperature below 30 K.
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22 August 2005
Research Article|
August 16 2005
Spontaneous spin-filter effect across heterojunction Available to Purchase
Jelena Trbovic;
Jelena Trbovic
a)
MARTECH and Department of Physics,
Florida State University
, Tallahassee, Florida 32306
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Cong Ren;
Cong Ren
MARTECH and Department of Physics,
Florida State University
, Tallahassee, Florida 32306
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Peng Xiong;
Peng Xiong
MARTECH and Department of Physics,
Florida State University
, Tallahassee, Florida 32306
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Stephan von Molnár
Stephan von Molnár
MARTECH and Department of Physics,
Florida State University
, Tallahassee, Florida 32306
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Jelena Trbovic
a)
MARTECH and Department of Physics,
Florida State University
, Tallahassee, Florida 32306
Cong Ren
MARTECH and Department of Physics,
Florida State University
, Tallahassee, Florida 32306
Peng Xiong
MARTECH and Department of Physics,
Florida State University
, Tallahassee, Florida 32306
Stephan von Molnár
MARTECH and Department of Physics,
Florida State University
, Tallahassee, Florida 32306a)
Electronic mail: [email protected]
Appl. Phys. Lett. 87, 082101 (2005)
Article history
Received:
April 04 2005
Accepted:
July 07 2005
Citation
Jelena Trbovic, Cong Ren, Peng Xiong, Stephan von Molnár; Spontaneous spin-filter effect across heterojunction. Appl. Phys. Lett. 22 August 2005; 87 (8): 082101. https://doi.org/10.1063/1.2034089
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