A three-dimensional electrothermal model has been developed to investigate the spatial resolution of the scanning thermoelectric microscopy (SThEM). We found that if the electrical resistivity of the sample changes abruptly, the SThEM will measure a voltage close to the local thermoelectric voltage where electrical resistivity is relatively low, rather than a simple weighted average of the thermoelectric voltage distribution based on the temperature profile. This is due to the presence of internal currents in the sample. The spatial resolution of the Seebeck profiling is limited by the finite value of the phonon mean free path of the sample and the tip size of the microscopy. With a tip size around 1 nm, the scanning thermoelectric microscopy can achieve a spatial resolution of the physical limit defined by the statistical nature of the charge carrier and phonon behavior in a very small region.
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1 August 2005
Research Article|
July 29 2005
Three-dimensional modeling of nanoscale Seebeck measurements by scanning thermoelectric microscopy
Zhixi Bian;
Zhixi Bian
Baskin School of Engineering,
University of California
, Santa Cruz, California 95064
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Ali Shakouri;
Ali Shakouri
a)
Baskin School of Engineering,
University of California
, Santa Cruz, California 95064
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Li Shi;
Li Shi
Department of Mechanical Engineering,
The University of Texas at Austin
, Austin, Texas 78712
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Ho-Ki Lyeo;
Ho-Ki Lyeo
Department of Physics,
The University of Texas at Austin
, Austin, Texas 78712
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C. K. Shih
C. K. Shih
Department of Physics,
The University of Texas at Austin
, Austin, Texas 78712
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a)
Author to whom correspondence should be addressed; electronic mail: [email protected]
Appl. Phys. Lett. 87, 053115 (2005)
Article history
Received:
February 08 2005
Accepted:
June 20 2005
Citation
Zhixi Bian, Ali Shakouri, Li Shi, Ho-Ki Lyeo, C. K. Shih; Three-dimensional modeling of nanoscale Seebeck measurements by scanning thermoelectric microscopy. Appl. Phys. Lett. 1 August 2005; 87 (5): 053115. https://doi.org/10.1063/1.2008381
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