We demonstrate a “standing-wave meter” for measuring dispersion and loss along the length of a planar InP-based photonic-crystal waveguide. Light from a tunable cw laser was coupled into a single line-defect waveguide that terminated inside the crystal structure to form a retroreflector. This structure created a standing wave which was imaged using a scanning near-field optical microscope. By measuring the intensity distribution of the standing wave for a range of optical frequencies, waveguide dispersion and loss were measured with high accuracy. Comparisons of the measurement results with three-dimensional numerical simulations reveal that material dispersion effects as small as 0.8% affect the band structure measurably.

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