High-resolution x-ray diffraction and transmission electron microscopy (TEM) have been used to study thin films grown on the bare and buffered (001) substrates. Reciprocal space mapping (RSM) around (002) and (103) reflections revealed that BFO films with a thickness of about 200 nm were almost fully relaxed and had a rhombohedral structure. Cross-sectional, high-resolution TEM showed that the films started to relax at a very early stage of growth, which was consistent with the RSM results. A thin intermediate layer of about 2 nm was observed at the interface, which had a smaller lattice than the overgrown film. Twist distortions about the axis to release the shear strain introduced by the growth of rhombic (001) on cubic (001) were also observed. The results indicate that a strained, coherent film on (001) is very difficult to maintain and (111) STO substrates are preferable.
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14 February 2005
Research Article|
February 09 2005
High-resolution x-ray diffraction and transmission electron microscopy of multiferroic films
Xiaoding Qi;
Xiaoding Qi
a)
Department of Materials Science and Metallurgy, University of Cambridge
, Pembroke Street, Cambridge CB2 3QZ, United Kingdom
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Ming Wei;
Ming Wei
Department of Materials Science and Metallurgy, University of Cambridge
, Pembroke Street, Cambridge CB2 3QZ, United Kingdom
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Yuan Lin;
Yuan Lin
Superconductivity Technology Center, Los Alamos National Laboratory
, Los Alamos, New Mexico 87545, USA
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Quanxi Jia;
Quanxi Jia
Superconductivity Technology Center, Los Alamos National Laboratory
, Los Alamos, New Mexico 87545, USA
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Dan Zhi;
Dan Zhi
Department of Materials Science and Metallurgy, University of Cambridge
, Pembroke Street, Cambridge CB2 3QZ, United Kingdom
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Joonghoe Dho;
Joonghoe Dho
Department of Materials Science and Metallurgy, University of Cambridge
, Pembroke Street, Cambridge CB2 3QZ, United Kingdom
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Mark G. Blamire;
Mark G. Blamire
Department of Materials Science and Metallurgy, University of Cambridge
, Pembroke Street, Cambridge CB2 3QZ, United Kingdom
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Judith L. MacManus-Driscoll
Judith L. MacManus-Driscoll
Department of Materials Science and Metallurgy, University of Cambridge
, Pembroke Street, Cambridge CB2 3QZ, United Kingdom
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a)
Author to whom correspondence should be addressed; electronic mail: [email protected]
Appl. Phys. Lett. 86, 071913 (2005)
Article history
Received:
June 28 2004
Accepted:
December 21 2004
Citation
Xiaoding Qi, Ming Wei, Yuan Lin, Quanxi Jia, Dan Zhi, Joonghoe Dho, Mark G. Blamire, Judith L. MacManus-Driscoll; High-resolution x-ray diffraction and transmission electron microscopy of multiferroic films. Appl. Phys. Lett. 14 February 2005; 86 (7): 071913. https://doi.org/10.1063/1.1866214
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