We studied the first-order diffracted moiré fringes of transparent multilayered structures comprised of irregularly deformed periodic patterns. By a comparison study of the diffracted moiré fringe pattern and detailed microscopy of the structure, we show that the diffracted moiré fringe can be used as a nondestructive tool to analyze the alignment of multilayered structures. We demonstrate the alignment method for the case of layer-by-layer microstructures using soft lithography. The alignment method yields high contrast of fringes even when the materials being aligned have very weak contrasts. The imaging method of diffracted moiré fringes is a versatile visual tool for the microfabrication of transparent deformable microstructures in layer-by-layer fashion.
Skip Nav Destination
Article navigation
16 May 2005
Research Article|
May 09 2005
Diffracted moiré fringes as analysis and alignment tools for multilayer fabrication in soft lithography
Jae-Hwang Lee;
Jae-Hwang Lee
Ames Laboratory-U.S. DOE and Department of Physics and Astronomy,
Iowa State University
, Ames, Iowa 50011
Search for other works by this author on:
Chang-Hwan Kim;
Chang-Hwan Kim
Ames Laboratory-U.S. DOE and Department of Physics and Astronomy,
Iowa State University
, Ames, Iowa 50011
Search for other works by this author on:
Yong-Sung Kim;
Yong-Sung Kim
Ames Laboratory-U.S. DOE and Department of Physics and Astronomy,
Iowa State University
, Ames, Iowa 50011
Search for other works by this author on:
Kai-Ming Ho;
Kai-Ming Ho
a)
Ames Laboratory-U.S. DOE and Department of Physics and Astronomy,
Iowa State University
, Ames, Iowa 50011
Search for other works by this author on:
Kristen Constant;
Kristen Constant
Department of Materials Science and Engineering,
Iowa State University
, Ames, Iowa 50011
Search for other works by this author on:
Wai Leung;
Wai Leung
Microelectronics Research Center and Ames Laboratory U.S. DOE,
Iowa State University
, Ames, Iowa 50011
Search for other works by this author on:
Cha-Hwan Oh
Cha-Hwan Oh
Department of Physics,
Hanyang University
, Seoul 133-791, South Korea
Search for other works by this author on:
a)
Electronic mail: kmh@ameslab.gov
Appl. Phys. Lett. 86, 204101 (2005)
Article history
Received:
January 21 2005
Accepted:
March 28 2005
Citation
Jae-Hwang Lee, Chang-Hwan Kim, Yong-Sung Kim, Kai-Ming Ho, Kristen Constant, Wai Leung, Cha-Hwan Oh; Diffracted moiré fringes as analysis and alignment tools for multilayer fabrication in soft lithography. Appl. Phys. Lett. 16 May 2005; 86 (20): 204101. https://doi.org/10.1063/1.1927268
Download citation file:
Sign in
Don't already have an account? Register
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Sign in via your Institution
Sign in via your InstitutionPay-Per-View Access
$40.00
Citing articles via
Related Content
Magnetic field control of moiré fringes on guanine crystal plate surface using its optical interference pattern
AIP Advances (January 2020)
Moiré fringes in conductive atomic force microscopy
Appl. Phys. Lett. (April 2023)
The Moiré Phenomenon
American Journal of Physics (April 1964)
Electron beam moiré fringes imaging by image converter tube with a magnetic lens
J. Appl. Phys. (June 2016)
Experimental Investigation on the Blurring of Spatial Moiré Fringes
Journal of Applied Physics (November 2003)