Thickness dependence of the ferroelectric $PbTiO3$ thin films on the dipolar relaxation in the microwave-frequency range Available to Purchase

The effects of film thickness on the dipolar relaxation of ferroelectric $PbTiO3$ thin films were investigated in the microwave-frequency range. The real and imaginary dielectric constants $(ε′–iε″)$ were measured up to $30GHz$ using interdigital capacitors on high-quality $SiO2$⁠. As the polycrystalline $PbTiO3$ film thickness increased from 42 to $407nm$⁠, the dipolar-relaxation frequency reduced with increasing grain size. The observed relaxation behavior for $ε′–iε″$ was explained in terms of the convolution of Debye relaxation. The relaxation frequency in the thin films was higher than the previous values reported in bulk $PbTiO3$⁠, due to the smaller grain size of the thin films.