Field-effect transistors consisted of vacuum-sublimed polycrystalline pentacene films and calcium source-drain electrodes were prepared and device characteristics were evaluated in an oxygen-free condition. The field-effect transistor showed typical ambipolar characteristics and field-effect hole mobility of and field-effect electron mobility of were estimated from saturation currents. Appearance of an electron enhancement mode in pentacene field-effect transistors was ascribed to the lowering of barrier for electron injection at source-drain electrodes. Effective elimination of electron traps using an oxygen-free condition was found to be another requirement for the observation of ambipolar behavior in pentacene.
REFERENCES
1.
V. Y.
Butko
, X.
Chi
, D. V.
Lang
, and A. P.
Ramirez
, Appl. Phys. Lett.
83
, 4773
(2003
).2.
H.
Klauk
, M.
Halik
, U.
Zschieschang
, G.
Schmid
, W.
Radlik
, and W.
Weber
, J. Appl. Phys.
92
, 5259
(2002
).3.
H.
Tada
, H.
Touda
, M.
Takada
, and K.
Matsushige
, Appl. Phys. Lett.
76
, 873
(2000
).4.
K.
Tada
, H.
Harada
, and K.
Yoshino
, Jpn. J. Appl. Phys., Part 2
36
, L718
(1997
).5.
E. J.
Meijer
, D. M. de
Leeuw
, S.
Setayesh
, E. van
Veenendaal
, B.-H.
Huisman
, P. W. M.
Blom
, J. C.
Hummelen
, U.
Scherf
, and T. M.
Klapwijk
, Nat. Mater.
2
, 678
(2003
).6.
A.
Dodabalapur
, H. E.
Katz
, L.
Torsi
, and R. C.
Haddon
, Appl. Phys. Lett.
68
, 1108
(1996
).7.
R. J.
Chersterfield
, C. R.
Newman
, T. M.
Pappenfus
, P. C.
Ewbank
, M. H.
Haukaas
, K. R.
Mann
, L. L.
Miller
, and C. D.
Frisbile
, Adv. Mater. (Weinheim, Ger.)
15
, 1278
(2003
).8.
M.
Pope
and C. E.
Swenberg
, Electronic Processes in Organic Crystals and Polymers
, 2nd ed. (Oxford University Press
, London, 1999
).9.
S.
Ogawa
, Y.
Kimura
, H.
Ishii
, and M.
Niwano
, Jpn. J. Appl. Phys., Part 2
42
, L1275
(2003
).10.
R. C.
Haddon
, A. S.
Perel
, R. C.
Morris
, T. T. M.
Palstra
, A. F.
Hebard
, and R. M.
Fleming
, Appl. Phys. Lett.
67
, 121
(1995
).11.
J. G.
Laquindanum
, H. E.
Katz
, A.
Dodabalapur
, and A. J.
Lovinger
, J. Am. Chem. Soc.
118
, 11331
(1996
).12.
N.
Tessler
and Y.
Roichman
, Appl. Phys. Lett.
79
, 2987
(2001
).13.
T.
Yasuda
, K.
Fujita
, H.
Nakashima
, and T.
Tsutsui
, Jpn. J. Appl. Phys., Part 1
42
, 6614
(2003
).14.
O. D.
Jurchescu
, J.
Baas
, and T. T. M.
Palstra
, Appl. Phys. Lett.
84
, 3061
(2004
).15.
Y. Y.
Lin
, D. J.
Gundlach
, and T. N.
Jackson
, Mater. Res. Soc. Symp. Proc.
413
, 413
(1996
).16.
A.
Bolognesi
, A. Di
Carlo
, and P.
Lugli
, Appl. Phys. Lett.
81
, 4646
(2002
).17.
N. J.
Watkins
, L.
Yan
, and Y.
Gao
, Appl. Phys. Lett.
80
, 4384
(2002
).© 2004 American Institute of Physics.
2004
American Institute of Physics
You do not currently have access to this content.