Thin films of thermochromic VO2, V1xWxO2 and V1xyWxTiyO2 (x=0.014, and y=0.12) were synthesized onto quartz substrates using a reactive pulsed laser deposition technique. The films were then characterized by x-ray diffraction and x-ray photoelectron spectroscopy. The W and Ti dopant effects on the semiconductor-to-metal phase transition of VO2 were investigated by measuring the temperature dependence of their electrical resistivity and their infrared transmittance. Remarkably strong effects of TiW codoping were observed on both the optical and electrical properties of V1xyWxTiyO2 films. The IR transmittance was improved, while the transition temperature could be varied from 36°C for W-doped VO2 film to 60°C for TiW codoped VO2 film. In addition, at room temperature, a higher temperature coefficient of resistance of 5.12%°C is achieved. Finally, both optical and electrical hysteresis are completely suppressed by TiW codoping the VO2 films.

1.
2.
R.
Flannery
and
J. E.
Miller
,
Proc. SPIE
1689
,
379
(
1992
).
3.
C. G.
Granqvist
,
E.
Avendaño
, and
A.
Azens
,
Thin Solid Films
442
,
201
(
2003
).
4.
M.
Fukuma
,
S.
Zembutsu
, and
S.
Miyazawa
,
Appl. Opt.
22
,
265
(
1983
).
5.
W. R.
Roach
,
Appl. Phys. Lett.
19
,
453
(
1971
).
6.
J. S.
Chivian
,
W. E.
Case
, and
D. H.
Rester
,
IEEE J. Quantum Electron.
QE-15
,
1326
(
1979
).
7.
C. E.
Lee
,
R. A.
Atkins
,
W. N.
Giler
, and
H. F.
Taylor
,
Appl. Opt.
28
,
4511
(
1989
).
8.
A.
Cavalleri
,
Cs.
Toth
,
C. W.
Siders
,
J. A.
Squier
,
F.
Raksi
,
P.
Forget
, and
J. C.
Kieffer
,
Phys. Rev. Lett.
87
,
237401
(
2001
).
9.
G. I.
Petrov
,
V. V.
Yakovlev
, and
J. A.
Squier
,
Opt. Lett.
27
,
655
(
2002
).
10.
R. V.
Kruzelecky
,
E.
Haddad
,
W.
Jamroz
,
M.
Soltani
,
M.
Chaker
,
D.
Nikanpour
, and
X.
Xian Jiang
,
SAE Proc. Paper 03ICES-242
(
2003
)
11.
F.
Béteille
and
J.
Livage
,
J. Sol-Gel Sci. Technol.
13
,
915
(
1998
).
12.
W.
Burkhardt
,
T.
Christman
,
S.
Francke
,
W.
Kriegseis
,
D.
Meister
,
B. K.
Meyer
,
W.
Neissner
,
D.
Schalch
, and
A.
Scharmann
,
Thin Solid Films
402
,
226
(
2002
).
13.
T. J.
Hanlon
,
J. A.
Coath
, and
M. A.
Richardson
,
Thin Solid Films
436
,
269
(
2003
).
14.
M.
Tazawa
,
P.
Jin
, and
S.
Tanemura
,
Appl. Opt.
37
,
1858
(
1998
).
15.
F.
Béteille
,
R.
Morineau
,
J.
Livage
, and
M.
Nagano
,
Mater. Res. Bull.
32
,
1109
(
1997
).
16.
I.
Takahashi
,
M.
Hibino
, and
T.
Kudo
,
Jpn. J. Appl. Phys., Part 1
40
,
1391
(
2001
).
17.
X. S.
Quing
,
M. A.
Hong-Ping
,
D. S.
Xun
, and
J. Z.
Hong
,
Chin. Phys. Lett.
20
,
148
(
2003
).
18.
T. J.
Hanlon
,
J. A.
Coath
, and
M. A.
Richardson
,
Thin Solid Films
436
,
269
(
2003
).
19.
Z. P.
Wu
,
A.
Miyashita
,
S.
Yamamoto
,
H.
Abe
,
I.
Nashiyama
,
K.
Narumi
, and
H.
Naramoto
,
J. Appl. Phys.
86
,
5311
(
1999
).
20.
Handbook of X-Ray Photoelectron Spectroscopy
, edited by
G. E.
Mullenberg
(
Perkin-Elmer
, Eden Prairie,
1979
)
21.
K. C.
Liddiard
,
Infrared Phys.
26
,
43
(
1986
).
22.
D.
Adler
, in
Solid State Physics: Advances in Research and Applications
, edited by
F.
Seitz
(
Academic
, New York, 1968), Vol.
21
, pp.
1
113
.
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