We report on the fabrication and electrical characterization of field-effect transistors at the surface of tetracene single crystals. We find that the mobility of these transistors reaches the room-temperature value of The nonmonotonous temperature dependence of the mobility, its weak gate voltage dependence, as well as the sharpness of the subthreshold slope, confirm the high quality of single-crystal devices. This is due to the fabrication process that does not substantially affect the crystal quality.
REFERENCES
1.
B. K.
Crone
, A.
Dodabalapur
, R.
Sarpeshkar
, R. W.
Filas
, Y.-Y.
Lin
, Z.
Bao
, J. H.
O’Neill
, W.
Li
, and H. E.
Katz
, J. Appl. Phys.
89
, 5125
(2001
).2.
G. H.
Gelinck
, T. C. T.
Geuns
, and D. M.
de Leeuw
, Appl. Phys. Lett.
77
, 1487
(2000
).3.
4.
W. A.
Schoonveld
, J.
Vrijmoeth
, and T. M.
Klapwijk
, Appl. Phys. Lett.
73
, 3884
(1998
).5.
C. D.
Dimitrakopoulos
and P. R. L.
Malenfant
, Adv. Mater. (Weinheim, Ger.)
14
, 99
(2002
).6.
7.
R. Farchioni and G. Grosso, Organic Electronic Materials (Springer, Berlin, 2001).
8.
H.
Klauk
, M.
Halik
, U.
Zschieschang
, G.
Schmid
, W.
Radlik
, and W.
Werner
, J. Appl. Phys.
92
, 5259
(2002
).9.
S. F.
Nelson
, Y.-Y.
Lin
, D. J.
Gundlach
, and T. N.
Jackson
, Appl. Phys. Lett.
72
, 1854
(1998
).10.
V.
Podzorov
, V. M.
Pudalov
, and M. E.
Gershenson
, Appl. Phys. Lett.
82
, 1739
(2003
).11.
12.
13.
14.
M.
Ichikawa
, H.
Yanagi
, Y.
Shimizu
, S.
Hotta
, N.
Suganuma
, T.
Koyama
, and Y.
Taniguchi
, Adv. Mater. (Weinheim, Ger.)
14
, 1272
(2002
).16.
R. A.
Laudise
, Ch.
Kloc
, P. G.
Simpkins
, and T.
Siegrist
, J. Cryst. Growth
187
, 449
(1998
).17.
Without RIE cleaning we observe a large spread in mobilities, which are on average much lower than the mobility of FETs made on RIE cleaned substrates. Additionally, we find much larger hysteresis in the electrical measurements and a large negative threshold voltage.
18.
J.
Vrijmoeth
, R. W.
Stok
, R.
Veldman
, W. A.
Schoonveld
, and T. M.
Klapwijk
, J. Appl. Phys.
83
, 3816
(1998
).19.
D. J.
Gundlach
, J. A.
Nichols
, L.
Zhou
, and T. N.
Jackson
, Appl. Phys. Lett.
80
, 2925
(2002
).20.
For holes, a positive threshold voltage implies conduction through the device in the absence of an applied gate voltage.
21.
Y.-Y.
Lin
, D. J.
Gundlach
, S. F.
Nelson
, and T. N.
Jackson
, IEEE Trans. Electron Devices
44
, 1325
(1997
).22.
U.
Sondermann
, A.
Kutoglu
, and H.
Bässler
, J. Phys. Chem.
89
, 1735
(1985
).23.
M. C. J. M.
Vissenberg
and M.
Matters
, Phys. Rev. B
57
, 12964
(1998
).24.
E. A. Silinsh and V. Čápek, Organic Molecular Crystals (AIP, New York, 1994).
25.
N.
Karl
, K.-H.
Kraft
, J.
Marktanner
, M.
Münch
, F.
Schatz
, R.
Stehle
, and H.-M.
Uhde
, J. Vac. Sci. Technol. A
17
, 2318
(1999
).26.
R. W. I.
de Boer
, M.
Jochemsen
, T. M.
Klapwijk
, A. F.
Morpurgo
, J.
Niemax
, A. K.
Tripathi
, and J.
Pflaum
, cond-mat/0308391.27.
See, also,
J.
Berrehar
, P.
Dellanoy
, and M.
Schott
, Phys. Status Solidi B
77
, K119
(1976
).28.
TOF experiments give a measure of the bulk mobility of charge carriers in the c direction of the crystal, whereas FET experiments probe the mobility of charge carriers at the crystal surface.
This content is only available via PDF.
© 2003 American Institute of Physics.
2003
American Institute of Physics
You do not currently have access to this content.