A 1 MHz quartz length extension resonator is used as a force sensor for a noncontact atomic force/scanning tunneling microscope (AFM/STM). A tungsten probe tip glued onto the end of the quartz rod enables the detection of tunneling currents for STM observation. Au surface was observed in both AFM and STM modes. The resolution difference is discussed in terms of the insulating oxide layer on the tip. We also demonstrate the AFM/STM observation of the surface with atomic resolution in an ultrahigh vacuum.
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