The present letter describes a method to make a spin-polarized scanning tunneling microscopy tip by applying voltage pulses between a W tip and a magnetic sample. This spin-polarized tip has the similar characteristics as an Fe-coated W tip, which was confirmed by observations of antiferromagnetically coupled ferromagnetic Mn(001) layers (>3 ML) grown on an Fe(001) whisker at 370 K. Furthermore, we demonstrate that these voltage pulses can vary the tip magnetization direction.
REFERENCES
1.
O.
Pietzsch
, A.
Kubetzka
, M.
Bode
, and R.
Wiesendanger
, Science
292
, 2053
(2001
).2.
S. Heinze, Ph.D. thesis, University of Hamburg, 2000.
3.
T. K. Yamada, M. M. J. Bischoff, G. M. M. Heijnen, T. Mizoguchi, and H. van Kempen, Phys. Rev. Lett. (to be published).
4.
W.
Wulfhekel
, H. F.
Ding
, W.
Lutzke
, G.
Steierl
, M.
Vázquez
, P.
Marı́n
, A.
Hernando
, and J.
Kirschner
, Appl. Phys. A: Mater. Sci. Process.
72
, 463
(2001
).5.
R.
Jansen
, M. W. J.
Prins
, and H.
van Kempen
, Phys. Rev. B
57
, 4033
(1998
).6.
7.
Y.
Suzuki
, W.
Nabhan
, R.
Shinohara
, K.
Yamaguchi
, and T.
Katayama
, J. Magn. Magn. Mater.
198–199
, 540
(1999
).8.
T. K.
Yamada
, M. M. J.
Bischoff
, T.
Mizoguchi
, and H.
van Kempen
, Surf. Sci.
516
, 179
(2002
).9.
U.
Staufer
, L.
Scandella
, H.
Rudin
, H.-J.
Güntherodt
, and N.
Garcia
, J. Vac. Sci. Technol. B
9
, 1389
(1991
).10.
D. A.
Tulchinsky
, D. T.
Pierce
, A. D.
Davies
, J. A.
Stroscio
, J.
Unguris
, and R. J.
Celotta
, J. Magn. Magn. Mater.
212
, 91
(2000
).11.
S.
Andrieu
, M.
Finazzi
, Ph.
Bauer
, H.
Fischer
, P.
Lefevre
, A.
Traverse
, K.
Hricovini
, G.
Krill
, and M.
Piecuch
, Phys. Rev. B
57
, 1985
(1998
).12.
13.
M. M. J.
Bischoff
, T.
Yamada
, A. J.
Quinn
, and H.
van Kempen
, Surf. Sci.
501
, 155
(2002
).14.
Using the single step height of bcc–Fe(001) which is 0.143 nm, the apparent step heights of our STM measurements were calibrated.
15.
Different refers to tips prepared on different days.
16.
17.
M. M. J. Bischoff, T. K. Yamada, C. M. Fang, R. A. de Groot, and H. van Kempen (unpublished).
18.
Using field emission spectroscopy we checked that a sharp tip with a tip radius of 20 nm became a blunter tip with a tip radius of 250 nm after applying many voltage pulses.
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