This letter reports the microfabrication, evaluation, and application of a boron-doped diamond microprobe with an integrated resistive heater element. The diamond heater with a pyramidal tip, which is formed at the end of two diamond beams, can be electrically heated by a flowing current. The high thermal conductivity of the diamond base supporting the heater element allows very quick thermal response of 0.45 μs. A hard-wearing sharp diamond tip formed by the silicon-lost mold technique shows excellent durability in contact operation with a sample. Diamond is well suited to use as a nanolithography tool for modification of a polymer, because polymer is hard to deposit on the tip during scanning due to the chemical inertness of the diamond surface. Demonstration of thermomechanical nanolithography with this heated probe exhibits line patterns with the feature size of 40 nm on a poly(methylmethacrylate) film.
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3 February 2003
Research Article|
February 03 2003
Scanning probe with an integrated diamond heater element for nanolithography
Joon Hyung Bae;
Joon Hyung Bae
Graduate School of Engineering, Tohoku University, 01 Aza Aoba, Aramaki, Aoba-ku, Sendai 980-8579, Japan
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Takahito Ono;
Takahito Ono
Graduate School of Engineering, Tohoku University, 01 Aza Aoba, Aramaki, Aoba-ku, Sendai 980-8579, Japan
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Masayoshi Esashi
Masayoshi Esashi
New Industry Creation Hatchery Center, Tohoku University, 01 Aza Aoba Aramaki Aoba-ku, Sendai 980-8579, Japan
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Appl. Phys. Lett. 82, 814–816 (2003)
Article history
Received:
October 07 2002
Accepted:
December 09 2002
Citation
Joon Hyung Bae, Takahito Ono, Masayoshi Esashi; Scanning probe with an integrated diamond heater element for nanolithography. Appl. Phys. Lett. 3 February 2003; 82 (5): 814–816. https://doi.org/10.1063/1.1541949
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