Pulsed laser deposition has been used to grow highly oriented on (001)MgO and miscut MgO off 001 toward 100) in the presence of a pulsed jet. The target stoichiometry was but films grown at were cation deficient and had a final composition of Visually, the films were specular, but spectroscopic ellipsometry measurements showed they were highly absorbing, requiring a short anneal in at to make them fully transparent. Pole figure analysis indicated that a thick film consisted of the characteristic antiphase domain structure of SBN, but four antiphase domains were found in a thin film. However, the formation of these additional domains was suppressed in a film grown on miscut MgO. Spectroscopic ellipsometry measurements have been made to measure surface and interface roughness, film thickness, as well as the spectroscopic refractive index and extinction coefficient of the films.
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5 May 2003
Research Article|
May 05 2003
Influence of MgO substrate miscut on domain structure of pulsed laser deposited as characterized by x-ray diffraction and spectroscopic ellipsometry
C. M. Rouleau;
C. M. Rouleau
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6056
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G. E. Jellison, Jr.;
G. E. Jellison, Jr.
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6056
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D. B. Beach
D. B. Beach
Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6119
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C. M. Rouleau
G. E. Jellison, Jr.
D. B. Beach
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6056
Appl. Phys. Lett. 82, 2990–2992 (2003)
Article history
Received:
November 08 2002
Accepted:
March 12 2003
Citation
C. M. Rouleau, G. E. Jellison, D. B. Beach; Influence of MgO substrate miscut on domain structure of pulsed laser deposited as characterized by x-ray diffraction and spectroscopic ellipsometry. Appl. Phys. Lett. 5 May 2003; 82 (18): 2990–2992. https://doi.org/10.1063/1.1572464
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