We have used two polytypes of silicon carbide single crystals, 4H-SiC and 6H-SiC, as the substrates for thin films grown by hybrid physical-chemical vapor deposition (HPCVD). The c-cut surface of both polytypes has a hexagonal lattice that matches closely with that of Thermodynamic calculations indicate that SiC is chemically stable under the in situ deposition conditions for using HPCVD. The films on both polytypes show high-quality epitaxy with a Rutherford backscattering channeling yield of 12%. They have above 40 K, low resistivities, high residual resistivity ratios, and high critical current densities. The results demonstrate that SiC is an ideal substrate for thin films.
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