Transmission generalized ellipsometry has been used to measure electric-field-induced birefringence in LiNbO3. By stepping an imaging lens over the end of an optical fiber attached to the detector, images of the retardation, fast axis, diattenuation, and depolarization can be obtained with a resolution of ∼31 μm. It is shown that the retardation and the fast axis in z-cut LiNbO3 under bias is not constant throughout the material, but can vary as much as a factor of 2. Furthermore, this retardation is a function of the magnitude and duration of the applied voltage.

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