A laser scanning microscope with a thermal spot size of about 4 μm is used to measure a quantity proportional to the rf current density in an operating superconducting coplanar waveguide microwave resonator. The twinning of the substrate produces a meandering of the current at the edges due to irregularities in the wet etching of the film associated with substrate twin domain blocks, and an enhancement of the rf photoresponse at these locations. These irregularities are candidates for enhanced nonlinear response from the device.
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