The size effect on the elastic constants of nanocrystalline tungsten has been investigated in the case of W/Cu multilayers with two modulation wavelengths (3.1 and 24.0 nm). Tungsten Young’s modulus and Poisson’s ratio have been measured thanks to a technique coupling x-ray diffraction with in situ tensile testing. It is demonstrated that the in-grain thin film elastic constants are highly microstructure—sensitive: in the “3.1 nm” multilayer, tungsten Poisson’s ratio is larger than the bulk one while it is smaller in the “24.0 nm” multilayer; a softening of tungsten Young’s modulus is evidenced in the case of the specimen with the smallest period.
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