We investigated conduction through an artificial grain-boundary junction made in thin films, deposited on a 36.7° bicrystal substrate using a laser ablation technique. The grain boundary exhibits substantial magnetoresistance at low temperatures and also shows nonlinear characteristics. Analysis of temperature dependence of the dynamic conductance allows us to identify three carrier transport mechanisms across the grain boundary. These mechanisms exist in parallel, and at a given temperature one mechanism may dominate. Particularly, at higher temperatures the transport across the grain boundary involves spin–flip scattering, which we establish leads to decrease of the bicrystal grain-boundary contribution in magnetoresistance. At lower temperature (4.2–45 K), tunneling through a disordered oxide at the grain boundary dominates, whereas in the temperature range from 100 to 175 K, carrier transport is dominated by inelastic tunneling via pairs of manganese atoms.
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8 July 2002
Research Article|
July 08 2002
Temperature dependence of magnetoresistance and nonlinear conductance of the bicrystal grain boundary in epitaxial thin films Available to Purchase
Neeraj Khare;
Neeraj Khare
National Physical Laboratory, Dr. K. S. Krishnan Road, New Delhi-110012, India
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U. P. Moharil;
U. P. Moharil
National Physical Laboratory, Dr. K. S. Krishnan Road, New Delhi-110012, India
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A. K. Gupta;
A. K. Gupta
National Physical Laboratory, Dr. K. S. Krishnan Road, New Delhi-110012, India
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A. K. Raychaudhuri;
A. K. Raychaudhuri
Department of Physics, Indian Institute of Science, Bangalore, India
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S. P. Pai;
S. P. Pai
Tata Institute of Fundamental Research, Colaba, Mumbai-400005, India
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R. Pinto
R. Pinto
Tata Institute of Fundamental Research, Colaba, Mumbai-400005, India
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Neeraj Khare
National Physical Laboratory, Dr. K. S. Krishnan Road, New Delhi-110012, India
U. P. Moharil
National Physical Laboratory, Dr. K. S. Krishnan Road, New Delhi-110012, India
A. K. Gupta
National Physical Laboratory, Dr. K. S. Krishnan Road, New Delhi-110012, India
A. K. Raychaudhuri
Department of Physics, Indian Institute of Science, Bangalore, India
S. P. Pai
Tata Institute of Fundamental Research, Colaba, Mumbai-400005, India
R. Pinto
Tata Institute of Fundamental Research, Colaba, Mumbai-400005, India
Appl. Phys. Lett. 81, 325–327 (2002)
Article history
Received:
January 30 2002
Accepted:
April 08 2002
Citation
Neeraj Khare, U. P. Moharil, A. K. Gupta, A. K. Raychaudhuri, S. P. Pai, R. Pinto; Temperature dependence of magnetoresistance and nonlinear conductance of the bicrystal grain boundary in epitaxial thin films. Appl. Phys. Lett. 8 July 2002; 81 (2): 325–327. https://doi.org/10.1063/1.1481785
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