The surface layers formed in waveguides, fabricated by Zn diffusion from the vapor phase, have been investigated by time of flight elastic recoil detection analysis using The key features of this technique, simultaneous profiling of all ions and a depth of analysis <1 μm, have allowed a detailed and quantitative characterization of the surface layers. The Zn diffusion into can be understood as a exchange process. As a consequence, an outermost layer of several hundreds of nanometers is formed, consisting of and phases showing complementary profiles. A good correlation has been found between the composition profiles and the optical waveguiding behavior. After thermal annealing of the waveguides, a thinner layer containing a uniform mixture of ZnO and is generated followed by a transition to a graded solid solution of Zn into
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9 September 2002
Research Article|
September 09 2002
Characterization of surface layers in Zn-diffused waveguides by heavy ion elastic recoil detection
O. Espeso-Gil;
O. Espeso-Gil
Centro de Micro-Análisis de Materiales, Univ. Autónoma de Madrid, 28049 Madrid, Spain
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G. Garcı́a;
G. Garcı́a
Centro de Micro-Análisis de Materiales, Univ. Autónoma de Madrid, 28049 Madrid, Spain
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F. Agulló-López;
F. Agulló-López
Centro de Micro-Análisis de Materiales, Univ. Autónoma de Madrid, 28049 Madrid, Spain
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A. Climent-Font;
A. Climent-Font
Centro de Micro-Análisis de Materiales, Univ. Autónoma de Madrid, 28049 Madrid, Spain
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T. Sajavaara;
T. Sajavaara
Accelerator Laboratory, P.O. Box 43, FIN-00014, University of Helsinki, Finland
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M. Domenech;
M. Domenech
Departamento de Fı́sica de Materiales, C-IV, Universidad Autónoma de Madrid, 28049 Madrid, Spain
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E. Cantelar;
E. Cantelar
Departamento de Fı́sica de Materiales, C-IV, Universidad Autónoma de Madrid, 28049 Madrid, Spain
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G. Lifante
G. Lifante
Departamento de Fı́sica de Materiales, C-IV, Universidad Autónoma de Madrid, 28049 Madrid, Spain
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Appl. Phys. Lett. 81, 1981–1983 (2002)
Article history
Received:
May 24 2002
Accepted:
July 22 2002
Citation
O. Espeso-Gil, G. Garcı́a, F. Agulló-López, A. Climent-Font, T. Sajavaara, M. Domenech, E. Cantelar, G. Lifante; Characterization of surface layers in Zn-diffused waveguides by heavy ion elastic recoil detection. Appl. Phys. Lett. 9 September 2002; 81 (11): 1981–1983. https://doi.org/10.1063/1.1506405
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