We demonstrate the direct heteroepitaxial growth of the ternary semiconductor on Si(111) substrates by means of molecular beam epitaxy. X-ray diffraction data prove the epitaxial growth of the films in the highly ordered chalcopyrite structure. Using photoluminescence, we are able to detect strong excitonic emissions up to room temperature, while photocurrent spectra reveal the A, B, and C valence-to-conduction-band transitions as they are typical for the tetragonal chalcopyrite structure.
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